T. Chiarella
发表
G. Groeseneken,
Luigi Pantisano,
G. Hellings,
2012,
Proceedings of Technical Program of 2012 VLSI Technology, System and Application.
P. Wambacq,
A. Mercha,
G. Van der Plas,
2013,
2013 IEEE International Electron Devices Meeting.
M. Van Hove,
T. Chiarella,
I. Debusschere,
2006,
2006 IEEE International Conference on Microelectronic Test Structures.
A. Mercha,
P. Roussel,
D. Verkest,
2011,
2011 Symposium on VLSI Technology - Digest of Technical Papers.
B. Kaczer,
G. Groeseneken,
T. Chiarella,
2007,
2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
P. Eyben,
D. Mocuta,
J. Mitard,
2016,
2016 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
J. Ryckaert,
T. Chiarella,
N. Horiguchi,
2020,
2020 IEEE Symposium on VLSI Technology.
D. Verkest,
T. Chiarella,
N. Horiguchi,
2012,
Proceedings of Technical Program of 2012 VLSI Technology, System and Application.
B. Parvais,
R. Rooyackers,
A. Mercha,
2009,
2009 International Symposium on VLSI Technology, Systems, and Applications.
H. Tigelaar,
T. Chiarella,
J. Ramos,
2006,
2006 International Electron Devices Meeting.
B. Kaczer,
T. Grasser,
D. Linten,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
S. Severi,
E. Augendre,
N. Collaert,
2006,
2006 IEEE international SOI Conferencee Proceedings.
L. Pantisano,
B. Kaczer,
H. Tigelaar,
2007,
2007 IEEE Symposium on VLSI Technology.
B. Kaczer,
G. Hellings,
D. Linten,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
FUSI Specific Yield Monitoring Enabling Improved Circuit Performance and Fast Feedback to Production
T. Hoffmann,
H. Tigelaar,
L. Witters,
2007,
2007 IEEE International Conference on Microelectronic Test Structures.
C. Ortolland,
L. Witters,
H. Bender,
2010,
2010 Symposium on VLSI Technology.
M. Van Hove,
T. Chiarella,
G. Van den bosch,
2006,
2006 International Interconnect Technology Conference.
C. Ortolland,
T. Chiarella,
W. Vandervorst,
2008,
2008 Symposium on VLSI Technology.
P. Soussan,
P. Wambacq,
A. Mercha,
2005,
Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005..
A. Mercha,
D. Verkest,
P. Raghavan,
2015,
2015 IEEE International Electron Devices Meeting (IEDM).
A. Mercha,
L. Witters,
J. Mitard,
2010,
2010 International Electron Devices Meeting.
Tom Schram,
T. Chiarella,
M. Togo,
2011
.
P. Soussan,
E. Beyne,
A. Mercha,
2010,
2010 Symposium on VLSI Technology.
A. Akheyar,
T. Chiarella,
C. Vrancken,
2008,
2008 Symposium on VLSI Technology.
L. Witters,
H. Bender,
T. Chiarella,
2010,
2010 Symposium on VLSI Technology.
C. Van Hoof,
P. De Moor,
K. De Munck,
2008,
IEEE Electron Device Letters.
T. Chiarella,
C. Vrancken,
A. Veloso,
2005,
Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005..
B. Kaczer,
P. Weckx,
D. Linten,
2016,
2016 IEEE International Electron Devices Meeting (IEDM).
Byoung Hun Lee,
L. Pantisano,
T. Chiarella,
2012,
IEEE Electron Device Letters.
S. Locorotondo,
H. Bender,
T. Chiarella,
2006,
2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers..
S. De Gendt,
S. Van Elshocht,
A. Akheyar,
2007,
2007 IEEE International Electron Devices Meeting.
C. Ortolland,
A. Akheyar,
T. Chiarella,
2006,
2009 Symposium on VLSI Technology.
P. Eyben,
L. Witters,
N. Collaert,
2010,
2010 Symposium on VLSI Technology.
A. Mercha,
D. Verkest,
M. Badaroglu,
2012,
International Electron Devices Meeting.
Naoto Horiguchi,
Geert Hellings,
Jerome Mitard,
2012
.
E. Simoen,
E. Vecchio,
H. Bender,
2013,
2013 Symposium on VLSI Technology.
Stefan Kubicek,
T. Chiarella,
Matty Caymax,
2004
.
S. Locorotondo,
T. Chiarella,
C. Vrancken,
2005,
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..