B. Vermeersch

发表

A. Shakouri, K. Maize, J. Christofferson, 2010, 2010 26th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM).

G. De Mey, B. Vermeersch, P. Kawka, 2007, IEEE Transactions on Components and Packaging Technologies.

A. Shakouri, K. Maize, K. Yazawa, 2012, 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.

M. Janicki, A. Napieralski, J. Banaszczyk, 2008, 2008 Twenty-fourth Annual IEEE Semiconductor Thermal Measurement and Management Symposium.

A. Shakouri, G. Pernot, Y. Koh, 2012, 13th InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems.

F. Catthoor, M. Stan, H. Oprins, 2022, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

N. Mingo, A. Roekeghem, B. Vermeersch, 2018, Physical Review Applied.

M. Janicki, A. Napieralski, J. Banaszczyk, 2007, 2007 13th International Workshop on Thermal Investigation of ICs and Systems (THERMINIC).

Marek Kaminski, Andrzej Napieralski, Marcin Janicki, 2009, Microelectron. J..

Bjorn Vermeersch, Natalio Mingo, Jesus Carrete, 2015, 1512.01354.

Ali Shakouri, Bjorn Vermeersch, Natalio Mingo, 2014, 1406.7341.

Gilbert De Mey, Bjorn Vermeersch, G. Mey, 2007, Microelectron. Reliab..

X. Cartoixà, P. Ye, J. Bahk, 2018, Nature Communications.

C. Adelmann, H. Oprins, D. H. Petersen, 2021, The Review of scientific instruments.

X. Cartoixà, P. Ye, J. Bahk, 2018, Nature Communications.

N. Collaert, B. Parvais, A. Alian, 2022, ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC).

E. Beyne, H. Oprins, B. Vermeersch, 2022, 2022 21st IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm).

J. Ryckaert, F. Catthoor, H. Oprins, 2023, 2023 IEEE International Reliability Physics Symposium (IRPS).

A. Jourdain, E. Beyne, A. De Keersgieter, 2022, International Electron Devices Meeting.

K. V. Kodandarama, G. Mannaert, N. Collaert, 2022, ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC).

N. Collaert, B. Parvais, A. Vais, 2022, 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).

J. Ryckaert, K. Bhuwalka, G. Hellings, 2022, 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits).

Gilbert De Mey, Bjorn Vermeersch, G. Mey, 2006, Microelectron. Reliab..

Andrzej Napieralski, Marcin Janicki, G. De Mey, 2007 .

G. De Mey, B. Vermeersch, G. De Mey, 2007, Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium.

G. Mey, B. Vermeersch, 2006, Proceedings of the International Conference Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006..