Grzegorz Wielgoszewski

Scanning probe microscopy investigations of the electrical properties of chemical vapor deposited graphene grown on a 6H-SiC substrate.

W. Strupinski, K. Gajewski, D. Kopiec, 2015, Micron.

A high-resolution measurement system for novel scanning thermal microscopy resistive nanoprobes

P. Janus, P. Grabiec, E. Zschech, 2011 .

Chapter Four – Scanning Thermal Microscopy (SThM): How to Map Temperature and Thermal Properties at the Nanoscale

Grzegorz Wielgoszewski, T. Gotszalk, G. Wielgoszewski, 2015 .

A low-noise measurement system for scanning thermal microscopy resistive nanoprobes based on a transformer ratio-arm bridge

Grzegorz Wielgoszewski, T. Gotszalk, G. Józwiak, 2018 .

Scanning thermal microscopy: A nanoprobe technique for studying the thermal properties of nanocomponents

P. Janus, M. Hecker, P. Grabiec, 2011 .

Investigation of thermal effects in through-silicon vias using scanning thermal microscopy.

R. Geer, Grzegorz Wielgoszewski, T. Gotszalk, 2014, Micron.