Christoph Doering

发表

Microfluidic Optical Shutter Flexibly - Actuated via Electrowetting-on-Dielectrics with

H. Fouckhardt, J. Strassner, Carina Heisel, 2017 .

Combination of Transverse Mode Selection and Active Longitudinal Mode-Locking of Broad Area Semiconductor Lasers

H. Fouckhardt, Christoph Doering, 2014 .

Compact dynamic microfluidic iris for active optics

H. Fouckhardt, Christoph Doering, Christina Kimmle, 2011 .

Fundamental Transverse Mode Selection (TMS#0) of Broad Area Semiconductor Lasers with Integrated Twice-Retracted 4f Set-Up and Film-Waveguide Lens

H. Fouckhardt, J. Strassner, Christoph Doering, 2017 .

Reactive Ion Etching (RIE) Induced Surface Roughness Precisely Monitored In-Situ and in Real Time by Reflectance Anisotropy Spectroscopy (RAS) in Combination with Principle Component Analysis (PCA)

H. Fouckhardt, J. Strassner, Christoph Doering, 2022, Advances in Materials Science and Engineering.

Reflectance anisotropy spectroscopy (RAS) for in-situ identification of roughness morphologies evolving during reactive ion etching (RIE)

H. Fouckhardt, J. Strassner, Christoph Doering, 2022, Applied Surface Science.

1 ML Wetting Layer upon Ga(As)Sb Quantum Dot (QD) Formation on GaAs Substrate Monitored with Reflectance Anisotropy Spectroscopy (RAS)

H. Fouckhardt, J. Strassner, Christoph Doering, 2018, Advances in OptoElectronics.

Epitaxial Growth of Optoelectronically Active Ga(As)Sb Quantum Dots on Al-Rich AlGaAs with GaAs Capsule Layers

H. Fouckhardt, J. Strassner, Christoph Doering, 2021 .

Precise in situ etch depth control of multilayered III−V semiconductor samples with reflectance anisotropy spectroscopy (RAS) equipment

H. Fouckhardt, J. Strassner, Christoph Doering, 2016, Beilstein journal of nanotechnology.

Doped or Quantum-Dot Layers as In Situ Etch-Stop Indicators for III/V Semiconductor Reactive Ion Etching (RIE) Using Reflectance Anisotropy Spectroscopy (RAS)

Johannes M. Richter, H. Fouckhardt, J. Strassner, 2021, Micromachines.

Atomic layer sensitive in-situ plasma etch depth control with reflectance anisotropy spectroscopy (RAS)

Henning Fouckhardt, Christoph Doering, Ann-Kathrin Kleinschmidt, 2017, Optical Metrology.

Influence of plasma composition on reflectance anisotropy spectra for in situ III–V semiconductor dry-etch monitoring

H. Fouckhardt, J. Strassner, Christoph Doering, 2015 .

In-situ etch-depth control better than 5 nm with reflectance anisotropy spectroscopy (RAS) equipment during reactive ion etching (RIE): A technical RAS application

H. Fouckhardt, J. Strassner, Christoph Doering, 2019, AIP Advances.

Internal Transverse Mode Selection in Folded-resonator Antimonide Broad Area Lasers

K. Huthmacher, H. Fouckhardt, Christoph Doering, 2010 .

Self-pulsation in broad area lasers with transverse-mode selective feedback

H. Fouckhardt, V. E. Sherstobitov, Christoph Doering, 2006 .

Lithography-Free Technology for the Preparation of Digital Microfluidic (DMF) Lab-Chips with Droplet Actuation by Optoelectrowetting (OEW)

H. Fouckhardt, J. Strassner, Christoph Doering, 2022, International Journal of Analytical Chemistry.

Microdroplet Actuation via Light Line Optoelectrowetting (LL-OEW)

H. Fouckhardt, J. Strassner, Christoph Doering, 2021, International journal of analytical chemistry.

Optoelectrowetting (OEW) with push-actuation of microdroplets at small frequencies and OEW equations revisited

H. Fouckhardt, J. Strassner, Christoph Doering, 2021, Sensors and Actuators A: Physical.

Broad area lasers with folded-resonator geometry for integrated transverse mode selection

Henning Fouckhardt, Klaus Huthmacher, Christoph Doering, 2011, OPTO.

Compact dynamic microfluidic iris array

Anna Steuer, Henning Fouckhardt, Christoph Doering, 2011, Optical Engineering + Applications.