A. Acovic
发表
A. C. Warren,
B. Davari,
G. Shahidi,
1992,
1992 International Technical Digest on Electron Devices Meeting.
Y. Taur,
T. Ning,
T. Lii,
1992
.
E. Crabbé,
F. Guarín,
S. Rauch,
1997,
1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual.
B. Davari,
H. Hanafi,
F. Cardone,
1992
.
Tak H. Ning,
Robert H. Dennard,
James D. Warnock,
1995,
IBM Journal of Research and Development.
F. Krummenacher,
C. Enz,
M. Kayal,
2017,
2017 International Conference on Noise and Fluctuations (ICNF).
A. Acovic,
K. Kern,
P. Fazan,
2002,
Microelectron. Reliab..
C. Hsu,
D. Dimaria,
L. Dori,
1993,
IEEE Electron Device Letters.
P. Habaš,
A. Acovic,
M. Bucher,
2017,
2017 International Conference on Noise and Fluctuations (ICNF).
E. Nowak,
A. Ray,
P. Agnello,
1996,
1996 Symposium on VLSI Technology. Digest of Technical Papers.
Y. Taur,
T. Lii,
D. Quinlan,
1993,
IEEE Electron Device Letters.
J. Warnock,
K. Jenkins,
D. Klaus,
1993,
Symposium 1993 on VLSI Technology.
Predrag Habas,
Alexandre Acovic,
P. Habaš,
2012
.