L. Milor
发表
Munkang Choi,
Cheng Jia,
L. Milor,
2004
.
Simulation of the circuit performance impact of lithography in nanoscale semiconductor manufacturing
L. Milor,
Munkang Choi,
L. Capodieci,
2003,
International Conference on Simulation of Semiconductor Processes and Devices, 2003. SISPAD 2003..
A. Sangiovanni-Vincentelli,
L. Milor,
1990,
1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers.
L. Milor,
L. Milor,
1999
.
Changsoo Hong,
L. Milor,
L. Milor,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
Taizhi Liu,
Linda Milor,
Kexin Yang,
2019,
Microelectronics Reliability.
L. Milor,
Rui Zhang,
K. Yang,
2018,
2018 International Integrated Reliability Workshop (IIRW).
L. Milor,
Fahad Ahmed,
2009,
2009 IEEE International Interconnect Technology Conference.
L. Milor,
S. Lim,
Fahad Ahmed,
2014
.
L. Milor,
M. Bashir,
2015,
IEEE Transactions on Semiconductor Manufacturing.
L. Milor,
Changsoo Hong,
2006,
2006 International Interconnect Technology Conference.
Hong Wang,
Shiyuan Yang,
Linda S. Milor,
2013,
IEICE Trans. Electron..
Rui Zhang,
L. Milor,
Taizhi Liu,
2022,
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
Taizhi Liu,
Linda Milor,
Rui Zhang,
2017,
2017 IEEE International Integrated Reliability Workshop (IIRW).
L. Milor,
Chieh-Yuan Chao,
L. Milor,
1995
.
Linda S. Milor,
Chieh-Yuan Chao,
L. Milor,
1995
.
Chang-Chih Chen,
Taizhi Liu,
Soonyoung Cha,
2015,
Microelectron. Reliab..
L. Milor,
L. Milor,
2013,
IEEE Transactions on Semiconductor Manufacturing.
Linda S. Milor,
Cheng Jia,
L. Milor,
2009,
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Linda S. Milor,
Seyed-Abdollah Aftabjahani,
L. Milor,
2009,
2009 WRI World Congress on Computer Science and Information Engineering.
Costas J. Spanos,
L. S. Milor,
C. Spanos,
1998
.
Taizhi Liu,
Linda Milor,
Kexin Yang,
2021,
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Chang-Chih Chen,
Taizhi Liu,
Linda Milor,
2018,
IEEE Transactions on Emerging Topics in Computing.
Taizhi Liu,
Linda S. Milor,
Woongrae Kim,
2017,
2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS).
Chang-Chih Chen,
Taizhi Liu,
Linda S. Milor,
2016,
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Chang-Chih Chen,
Taizhi Liu,
Linda S. Milor,
2015,
Sixteenth International Symposium on Quality Electronic Design.
Rui Zhang,
L. Milor,
Taizhi Liu,
2019,
Microelectronics Reliability.
Alberto L. Sangiovanni-Vincentelli,
Linda S. Milor,
A. Sangiovanni-Vincentelli,
1994,
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
Linda S. Milor,
V. Visvanathan,
V. Visvanathan,
1989,
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
Kurt Keutzer,
Linda S. Milor,
Michael Orshansky,
2000,
IEEE/ACM International Conference on Computer Aided Design. ICCAD - 2000. IEEE/ACM Digest of Technical Papers (Cat. No.00CH37140).
Linda S. Milor,
Fahad Ahmed,
L. Milor,
2016,
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Chang-Chih Chen,
Linda S. Milor,
L. Milor,
2015,
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Chang-Chih Chen,
Linda Milor,
L. Milor,
2013,
5th IEEE International Workshop on Advances in Sensors and Interfaces IWASI.
Taizhi Liu,
Linda Milor,
Rui Zhang,
2017,
Microelectron. Reliab..
Chang-Chih Chen,
Taizhi Liu,
Linda S. Milor,
2016,
2016 IEEE 34th International Conference on Computer Design (ICCD).
Chang-Chih Chen,
Taizhi Liu,
Linda S. Milor,
2015,
Microelectron. Reliab..
Linda Milor,
Changsoo Hong,
L. Milor,
2010,
IEEE Transactions on Semiconductor Manufacturing.
Chang-Chih Chen,
Taizhi Liu,
Soonyoung Cha,
2014,
2014 IEEE 32nd VLSI Test Symposium (VTS).
Daehyun Kim,
Linda S. Milor,
L. Milor,
2016,
2016 IEEE 34th VLSI Test Symposium (VTS).
Soonyoung Cha,
Daehyun Kim,
Linda S. Milor,
2015,
Microelectron. Reliab..
L. Milor,
Chieh-Yuan Chao,
L. Milor,
1994,
Proceedings of IEEE Custom Integrated Circuits Conference - CICC '94.
Chang-Chih Chen,
Taizhi Liu,
Soonyoung Cha,
2014,
2014 IEEE International Reliability Physics Symposium.
Linda Milor,
Dae-Hyun Kim,
L. Milor,
2017,
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Taizhi Liu,
Linda Milor,
Kexin Yang,
2017,
2017 IEEE International Integrated Reliability Workshop (IIRW).
L. Milor,
Munkang Choi,
L. Capodieci,
2003
.
Linda Milor,
Dae-Hyun Kim,
L. Milor,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
Chang-Chih Chen,
Soonyoung Cha,
Linda S. Milor,
2014,
2014 IEEE International Reliability Physics Symposium.
Hong-Yi Huang,
Cheng Jia,
Munkang Choi,
2003,
2003 46th Midwest Symposium on Circuits and Systems.
Impact of spatial intrachip gate length variability on theperformance of high-speed digital circuits
Kurt Keutzer,
Linda S. Milor,
Michael Orshansky,
2002,
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
Sung Kyu Lim,
Daehyun Kim,
Linda S. Milor,
2011,
Microelectron. Reliab..
Linda Milor,
L. Milor,
Muhammad M. Bashir,
2010,
2010 IEEE International Reliability Physics Symposium.
Linda S. Milor,
Muhammad Bashir,
L. Milor,
2009,
IEEE Design & Test of Computers.