F. Beaudoin
发表
Hervé Lapuyade,
D. Lewis,
Philippe Perdu,
2001
.
F. Beaudoin,
T. Zortea,
G. Deliyannides,
2008,
2008 IEEE Radio Frequency Integrated Circuits Symposium.
P. Perdu,
V. Pouget,
D. Lewis,
2005,
Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005..
P. Perdu,
D. Lewis,
T. Beauchêne,
2002,
Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614).
Leigh M. Norris,
L. Viola,
F. Beaudoin,
2019,
1912.04982.
A Walther,
S. Kröll,
N. Lin,
2010,
Physical review letters.
Romain Desplats,
Philippe Perdu,
Dean Lewis,
2003,
Microelectron. Reliab..
P. Perdu,
D. Lewis,
T. Beauchêne,
2003,
Proceedings of the 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2003.
Philippe Perdu,
Dean Lewis,
Felix Beaudoin,
2003,
Proceedings of the 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2003.
Romain Desplats,
Philippe Perdu,
Felix Beaudoin,
2000
.
Philippe Perdu,
Dean Lewis,
Felix Beaudoin,
2000
.
Lorenza Viola,
Gerardo A. Paz-Silva,
Leigh M. Norris,
2019,
Physical Review A.
Romain Desplats,
Philippe Perdu,
Kevin Sanchez,
2005,
Microelectron. Reliab..
Romain Desplats,
Philippe Perdu,
Dean Lewis,
2002,
Microelectron. Reliab..
Romain Desplats,
Philippe Perdu,
Felix Beaudoin,
2005,
Microelectron. Reliab..
L. Viola,
F. Beaudoin,
L. Norris,
2018,
Physical Review A.
W. A. Coish,
F. Beaudoin,
D. Lachance-Quirion,
2016,
Nanotechnology.
P. Perdu,
D. Lewis,
K. Sanchez,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
P. Perdu,
D. Lewis,
F. Beaudoin,
2003
.
F. Beaudoin,
2016
.
Romain Desplats,
Philippe Perdu,
Dean Lewis,
2002,
Microelectron. Reliab..
Franco Stellari,
Alan J. Weger,
Peilin Song,
2003,
Microelectron. Reliab..
L. Viola,
F. Beaudoin,
Francisco Riberi,
2022,
New Journal of Physics.
F. Beaudoin,
F. Pressecq,
X. Lafontan,
2009,
2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.
F. Beaudoin,
M. El-Gamal,
F. Beaudoin,
2002,
The 2002 45th Midwest Symposium on Circuits and Systems, 2002. MWSCAS-2002..
Jay M. Gambetta,
F. Beaudoin,
J. Gambetta,
2012,
1204.2237.
J. Gambetta,
A. Blais,
F. Beaudoin,
2011,
1107.3990.
Lorenza Viola,
Fei Yan,
Youngkyu Sung,
2019,
Nature Communications.
Alexandre Blais,
Zachary Dutton,
Z. Dutton,
2012,
1208.1946.
W. A. Coish,
A. Blais,
F. Beaudoin,
2016,
1602.05090.
Djemel Lellouchi,
Francis Pressecq,
Petra Schmitt,
2003,
Microelectron. Reliab..
F. Beaudoin,
B. Domengès,
H. Murray,
2002,
Microelectron. Reliab..
P. Perdu,
F. Beaudoin,
G. Imbert,
2001,
Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2001 (Cat. No.01TH8548).