A. Touboul
发表
Hervé Lapuyade,
D. Lewis,
Philippe Perdu,
2001
.
F. Wrobel,
A. Michez,
R. Germanicus,
2020,
IEEE Transactions on Nuclear Science.
A. Michez,
F. Saigné,
A. Touboul,
2018,
IEEE Transactions on Nuclear Science.
Alexander Koelpin,
Cedric Virmontois,
Vincent Pouget,
2021,
IEEE Transactions on Nuclear Science.
M. Bafleur,
P. Perdu,
V. Pouget,
2006,
IEEE Transactions on Device and Materials Reliability.
P. Rech,
F. Wrobel,
A. Touboul,
2013,
IEEE Transactions on Nuclear Science.
F. Wrobel,
F. Wrobel,
A. Touboul,
2013,
IEEE Transactions on Nuclear Science.
F. Wrobel,
F. Wrobel,
A. Touboul,
2011,
IEEE Transactions on Nuclear Science.
P. Perdu,
D. Lewis,
T. Beauchêne,
2003,
Proceedings of the 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2003.
P. Adell,
E. Lorfèvre,
A. Michez,
2015,
2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
Antoine D. Touboul,
Frédéric Saigné,
Jerome Boch,
2013,
Microelectron. Reliab..
E. Lorfèvre,
F. Wrobel,
A. Michez,
2017,
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
N. Chatry,
E. Lorfèvre,
F. Wrobel,
2013,
IEEE Transactions on Nuclear Science.
Y. Gonzalez-Velo,
F. Saigné,
A. Touboul,
2013,
Applied Nanoscience.
Y. Gonzalez-Velo,
F. Saigné,
A. Touboul,
2011,
2011 12th European Conference on Radiation and Its Effects on Components and Systems.
N. Chatry,
L. Dusseau,
E. Lorfèvre,
2016,
IEEE Transactions on Nuclear Science.
N. Nolhier,
P. Perdu,
V. Pouget,
2005,
Microelectron. Reliab..
peixiong zhao,
J. Autran,
F. Wrobel,
2014,
IEEE Transactions on Nuclear Science.
E. Lorfèvre,
F. Saigné,
A. Touboul,
2012,
IEEE Transactions on Nuclear Science.
Synergy of non-ionizing and ionizing processes in the reliability degradation of Power MOSFETs oxide
E. Lorfèvre,
F. Wrobel,
F. Saigné,
2011,
2011 12th European Conference on Radiation and Its Effects on Components and Systems.
F. Saigné,
A. Touboul,
J. Bonnet,
2007
.
A. Michez,
A. Touboul,
J. Boch,
2022,
Materials Science Forum.
J. Autran,
F. Wrobel,
F. Saigné,
2012,
IEEE Transactions on Nuclear Science.
J. Autran,
P. Rech,
F. Wrobel,
2011,
IEEE Transactions on Nuclear Science.
F. Saigné,
A. Touboul,
J. Bonnet,
2008
.
Electrostatic Mechanisms Responsible for Device Degradation in Proton Irradiated AlGaN/AlN/GaN HEMTs
A. Touboul,
peixiong zhao,
R. Reed,
2008,
IEEE Transactions on Nuclear Science.
E. Lorfèvre,
F. Wrobel,
F. Saigné,
2012
.
J. Gasiot,
F. Saigné,
A. Touboul,
2007
.
J. Gasiot,
A. Touboul,
J. Bonnet,
2006
.
F. Saigné,
A. Touboul,
J. Bonnet,
2008
.
G. Bruguier,
J. Gasiot,
F. Saigné,
2005
.
E. Lorfèvre,
F. Wrobel,
F. Saigné,
2008,
IEEE Transactions on Nuclear Science.
M. Caussanel,
peixiong zhao,
D. Fleetwood,
2007,
IEEE Transactions on Nuclear Science.
G. Tsiligiannis,
L. Dilillo,
A. Bosio,
2013,
IEEE Transactions on Nuclear Science.
Arnaud Virazel,
Patrick Girard,
Alberto Bosio,
2012
.
Arnaud Virazel,
Alberto Bosio,
Luigi Dilillo,
2012,
2012 IEEE 18th International On-Line Testing Symposium (IOLTS).
L. Dusseau,
S. Furic,
A. Michez,
2019,
IEEE Transactions on Nuclear Science.
F. Wrobel,
A. Michez,
A. Touboul,
2021,
IEEE Transactions on Nuclear Science.
F. Wrobel,
N. Chatry,
R. Arinero,
2014,
IEEE Transactions on Nuclear Science.
Vincent Pouget,
Y. Q. Aguiar,
Frédéric Wrobel,
2020,
Microelectronics Reliability.
J.-L. Autran,
Antoine D. Touboul,
Frédéric Saigné,
2018,
Microelectron. Reliab..
Vincent Pouget,
Jean-Luc Autran,
Y. Q. Aguiar,
2020,
Aerospace.
F. Wrobel,
R. D. Schrimpf,
peixiong zhao,
2013,
IEEE Transactions on Nuclear Science.
Antoine Touboul,
Jean Gasiot,
Frédéric Saigné,
2008
.
Vincent Pouget,
Y. Q. Aguiar,
Frédéric Wrobel,
2020,
Microelectronics Reliability.
Frédéric Saigné,
Antoine Touboul,
Jerome Boch,
2016
.
P. Eyben,
P. Leclère,
R. Germanicus,
2015
.
Y. Gonzalez-Velo,
F. Saigné,
B. Gautier,
2011
.
peixiong zhao,
R. Reed,
D. Fleetwood,
2007,
2007 9th European Conference on Radiation and Its Effects on Components and Systems.
Luigi Dilillo,
Robert Ecoffet,
Frederic Wrobel,
2016,
IEEE Transactions on Nuclear Science.
Antoine Touboul,
Patrick Dubus,
Frédéric Saigné,
2021,
Electronics.
V. Pouget,
Frédéric Saigné,
Jerome Boch,
2019,
IEEE Transactions on Nuclear Science.
E. Lorfèvre,
F. Wrobel,
F. Saigné,
2009,
IEEE Transactions on Nuclear Science.
Ronald D. Schrimpf,
Daniel M. Fleetwood,
R. Arinero,
2011,
Microelectron. Reliab..
Antoine D. Touboul,
Frédéric Saigné,
Jerome Boch,
2013,
Microelectron. Reliab..
Antoine D. Touboul,
Frederic Wrobel,
Frederic Saigne,
2013,
IEEE Transactions on Nuclear Science.
Antoine D. Touboul,
Frédéric Saigné,
Frederic Wrobel,
2012,
Microelectron. Reliab..
Determining Realistic Parameters for the Double Exponential Law that Models Transient Current Pulses
L. Dilillo,
F. Wrobel,
V. Pouget,
2014,
IEEE Transactions on Nuclear Science.
Frederic Wrobel,
Israel C. Lopes,
Vincent Pouget,
2020,
2020 IEEE Latin-American Test Symposium (LATS).