Kentaro Takagi

A Comprehensive Big-Data-Based Monitoring System for Yield Enhancement in Semiconductor Manufacturing

Ryohei Orihara, Kentaro Takagi, Kouta Nakata, 2017, IEEE Transactions on Semiconductor Manufacturing.

RDEC: Integrating Regularization into Deep Embedded Clustering for Imbalanced Datasets

Kentaro Takagi, Yaling Tao, Kouta Nakata, 2018, ACML.

Clustering-friendly Representation Learning via Instance Discrimination and Feature Decorrelation pdf

Kentaro Takagi, Kouta Nakata, Yaling Tao, 2021, ICLR.

A comprehensive “big-data-based” monitoring system for yield enhancement in semiconductor man ufacturing

Ryohei Orihara, Kentaro Takagi, Kouta Nakata, 2016, 2016 International Symposium on Semiconductor Manufacturing (ISSM).