R. Behtash

A Broadband GaN-MMIC power amplifier for L to X Bands

W. Heinrich, C. Meliani, G. Trankle, 2007, 2007 European Microwave Integrated Circuit Conference.

Analysis of the Survivability of GaN Low-Noise Amplifiers

G. Tränkle, J. Wurfl, W. Heinrich, 2007, IEEE Transactions on Microwave Theory and Techniques.

Reliability and degradation mechanism of AlGaN/GaN HEMTs for next generation mobile communication systems

Maximilian Dammann, Rüdiger Quay, Michael Mikulla, 2008, 2008 ROCS Workshop [Reliability of Compound Semiconductors Workshop].

Reliability behavior of GaN HEMTs related to Au diffusion at the Schottky interface

Hervé Blanck, K. Riepe, R. Behtash, 2009 .

GaN Technologies Applications , Status and Trends

Marc Camiade, Hervé Blanck, Didier Floriot, 2009 .

Reliability data's of 0.5 μm AlGaN/GaN on SiC technology qualification

D. Floriot, Hervé Blanck, Benoit Lambert, 2012, Microelectron. Reliab..