D. Tremouilles
发表
F. Caignet,
N. Nolhier,
M. Bafleur,
2011,
10th International Symposium on Electromagnetic Compatibility.
M. Bafleur,
D. Tremouilles,
M. A. Diatta,
2012,
IEEE Transactions on Device and Materials Reliability.
G. Groeseneken,
M. Sawada,
D. Linten,
2007,
2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
G. Groeseneken,
M. Sawada,
D. Linten,
2007,
2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
N. Nolhier,
M. Bafleur,
D. Tremouilles,
2009,
2009 31st EOS/ESD Symposium.
M. Bafleur,
D. Tremouilles,
H. Arbess,
2011,
EOS/ESD Symposium Proceedings.
R. Rooyackers,
G. Groeseneken,
M. Sawada,
2008,
EOS/ESD 2008 - 2008 30th Electrical Overstress/Electrostatic Discharge Symposium.
M. Bafleur,
D. Tremouilles,
Yuan Gao,
2008,
2008 IEEE Bipolar/BiCMOS Circuits and Technology Meeting.
N. Collaert,
D. Linten,
G. Groeseneken,
2007,
2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
N. Nolhier,
M. Bafleur,
D. Tremouilles,
2004,
IEEE Journal of Solid-State Circuits.
P. Wambacq,
G. Groeseneken,
J. Borremans,
2007,
2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
M. Sawada,
G. Groeseneken,
M. Bafleur,
2007,
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.
R. Plana,
N. Nolhier,
D. Tremouilles,
2009,
2009 31st EOS/ESD Symposium.
P. Perdu,
D. Tremouilles,
G. Bertrand,
2002,
2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595).
F. Caignet,
N. Nolhier,
F. Lafon,
2011,
EOS/ESD Symposium Proceedings.
G. Groeseneken,
V.A. Vashchenko,
M. Sawada,
2006,
2006 Electrical Overstress/Electrostatic Discharge Symposium.
F. Caignet,
N. Nolhier,
M. Bafleur,
2012,
IEEE Transactions on Device and Materials Reliability.
M. Sawada,
S. Decoutere,
D. Linten,
2005,
Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005..
C. Duvvury,
N. Collaert,
D. Linten,
2007,
2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
R. Rooyackers,
C. Duvvury,
N. Collaert,
2009,
2009 31st EOS/ESD Symposium.
P. Perdu,
M. Bafleur,
D. Tremouilles,
2004,
2004 Electrical Overstress/Electrostatic Discharge Symposium.
G. Meneghesso,
E. Simoen,
C. Claeys,
2010,
IEEE Transactions on Device and Materials Reliability.
M. Bafleur,
D. Tremouilles,
C. Anceau,
2012,
IEEE Transactions on Electron Devices.
F. Caignet,
N. Nolhier,
M. Bafleur,
2013,
IEEE Transactions on Electromagnetic Compatibility.
G. Meneghesso,
L. Witters,
N. Collaert,
2009,
2009 31st EOS/ESD Symposium.
R. Rooyackers,
G. Meneghesso,
C. Duvvury,
2008,
2008 IEEE International Electron Devices Meeting.
R. Rooyackers,
C. Duvvury,
N. Collaert,
2008,
IEEE Transactions on Electron Devices.