R. Stancliff
发表
R. Stancliff,
2017,
2017 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference (IMOC).
G. R. Basawapatna,
R. Stancliff,
G. Basawapatna,
1979
.
Quantitative scanning near-field microwave microscopy for thin film dielectric constant measurement.
D. W. van der Weide,
A. Bettermann,
R. Stancliff,
2008,
The Review of scientific instruments.
A. O. Oladipo,
E. Proietti,
R. Marcelli,
2015,
2015 European Microwave Conference (EuMC).
R.B. Stancliff,
D.B. Poulin,
R. Stancliff,
1979,
1979 IEEE MTT-S International Microwave Symposium Digest.