H. Sagong
发表
Ji-Hyun Lee,
Eun-Bi Kim,
H. Sagong,
2022,
Frontiers in Marine Science.
Yoon-Ha Jeong,
Chang Yong Kang,
R. Jammy,
2012,
Proceedings of Technical Program of 2012 VLSI Technology, System and Application.
C. Kang,
E. Jeong,
Y. Jeong,
2012,
2012 IEEE International Integrated Reliability Workshop Final Report.
K. Jeon,
C. Kang,
E. Jeong,
2011,
IEEE Electron Device Letters.
B. H. Lee,
H. Takeuchi,
C. Kang,
2009,
2009 Spanish Conference on Electron Devices.
C. Kang,
E. Jeong,
Y. Jeong,
2010,
2010 IEEE Nanotechnology Materials and Devices Conference.
S. Pae,
Junekyun Park,
H. Sagong,
2020,
2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).
Sungho Kim,
Yoon-Ha Jeong,
Dong-Won Kim,
2013,
IEEE Electron Device Letters.
David Moreau,
Bong Ki Lee,
HwaSung Rhee,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).
Hoyoung Kang,
Hyun-Chul Sagong,
Junekyun Park,
2018,
2018 IEEE International Reliability Physics Symposium (IRPS).
Kinam Kim,
K. Yeo,
Dong-Won Kim,
2010,
2010 IEEE International Reliability Physics Symposium.
C. Kang,
Jeong-Soo Lee,
Y. Jeong,
2011,
2011 International Reliability Physics Symposium.
The Effect of a Si Capping Layer on RF Characteristics of High-$k$ /Metal Gate SiGe Channel pMOSFETs
Jack C. Lee,
C. Kang,
Jungwoo Oh,
2010,
IEEE Electron Device Letters.
Yoon-Ha Jeong,
Chang Yong Kang,
Kyung Taek Lee,
2009,
IEEE Electron Device Letters.
Sangwoo Pae,
Jinju Kim,
Junekyun Park,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
Hyunjin Kim,
Hyunwoo Lee,
Yoohwan Kim,
2015,
2015 IEEE International Reliability Physics Symposium.
H. Shim,
Junekyun Park,
H. Sagong,
2020,
2020 IEEE International Electron Devices Meeting (IEDM).
S. Pae,
Wonchang Kang,
H. Shim,
2019,
IEEE Transactions on Electron Devices.
Hyunjin Kim,
Minjung Jin,
Hyun-Chul Sagong,
2018,
2018 IEEE International Reliability Physics Symposium (IRPS).
H. J. Kim,
J. J. Kim,
S. W. Pae,
2015,
2015 IEEE International Electron Devices Meeting (IEDM).
T. Jeong,
S. Pae,
H. C. Sagong,
2018,
2018 IEEE Symposium on VLSI Technology.
Seungbae Lee,
Taiki Uemura,
Soonyoung Lee,
2018,
2018 IEEE International Reliability Physics Symposium (IRPS).
Sangwoo Pae,
Minjung Jin,
Jin Ju Kim,
2018,
2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
Rakesh Ranjan,
Md. Iqbal Mahmud,
HwaSung Rhee,
2021,
2021 IEEE International Reliability Physics Symposium (IRPS).