D. Appello

Session details: Fault tolerant techniques

L. Anghel, D. Appello, 2008, DATE '08.

An I-IP for the Debug of Microprocessor Cores

Maurizio Rebaudengo, Matteo Sonza Reorda, Michelangelo Grosso, 2005 .

A new DFM-proactive technique

Paolo Bernardi, Maurizio Rebaudengo, Matteo Sonza Reorda, 2005 .

A programmable BIST approach for the diagnosis of embedded memory cores

Massimo Violante, Paolo Bernardi, Maurizio Rebaudengo, 2003 .

A practical evaluation of I/sub DDQ/ test strategies for deep submicron production test application. Experiences and targets from the field

D. Appello, A. Fudoli, H. Manhaeve, 2003, The Eighth IEEE European Test Workshop, 2003. Proceedings..

An Automatic Functional Stress Pattern Generation Technique Suitable for SoC Reliability Characterization

Matteo Sonza Reorda, Michelangelo Grosso, D. Appello, 2008 .

Multi-primitive hierarchical stereo matching for 3-D measurement of road structures

Paolo Gamba, Alessandro Mecocci, D. Appello, 1997, Proceedings of 13th International Conference on Digital Signal Processing.

Enabling Effective Yield Learning through Actual DFM-Closure at the SoC Level

D. Appello, C. Hay, G. Green, 2007, 2007 IEEE/SEMI Advanced Semiconductor Manufacturing Conference.

Design for Test and Test Equipment Roadmap

D. Appello, 2018 .