M. Lane

发表

J. Lloyd, E. Liniger, M. Lane, 2002, IEEE International Integrated Reliability Workshop Final Report, 2002..

B. Herbst, E. Liniger, T. Shaw, 2007, 2007 IEEE International Interconnect Technology Conferencee.

D. Restaino, T. Shaw, M. Lane, 2004, Proceedings of the IEEE 2004 International Interconnect Technology Conference (IEEE Cat. No.04TH8729).

G. Ramanath, U. Tisch, S. Nayak, 2007, Nature.

Michael Lane, Reinhold H. Dauskardt, R. Dauskardt, 1998 .

S. Gates, M. Lane, A. B. Hall, 2012 .

Michael W. Lane, Jeffrey M. Snodgrass, Reinhold H. Dauskardt, 2001, Microelectron. Reliab..

F. Mcfeely, R. Rosenberg, P. Vereecken, 2003 .

Thomas M. Shaw, Michael Lane, T. Shaw, 2007 .

B. Herbst, E. Liniger, T. Shaw, 2007, 2007 IEEE International Interconnect Technology Conferencee.

M. Lane, T. Shaw, Xia Hu Liu, 2004, IEEE Transactions on Device and Materials Reliability.

C.-K. Hu, R. Rosenberg, J. Lloyd, 2005, IEEE Transactions on Device and Materials Reliability.