B. Serio

发表

Static and dynamic calibration of thin-film thermocouples by means of a laser modulation technique

P. Nika, J. Prenel, B. Serio, 2000 .

Far field optical nanoscopy: How far can you go in nanometric characterization without resolving all the details?

P. A. Montgomery, F. Anstotz, B. Serio, 2013 .

In-plane measurements of microelectromechanical systems vibrations with nanometer resolution using the correlation of synchronous images

B. Cretin, B. Serio, J. Hunsinger, 2004 .

A gold–palladium thin-film microsensor array for thermal imaging of laser beam waists

H. Gualous, J. Prenel, B. Serio, 2000 .

Anisole fluorescence spectroscopy for temperature measurements with a Hg (Xe) arc lamp excitation

P. Guibert, B. Serio, J. Bonnety, 2017 .

Photonic jet breakthrough for direct laser microetching using nanosecond near-infrared laser.

Bernard Y. Tumbelaka, J. Fontaine, B. Serio, 2014, Applied optics.

Parallel Optical Profilometry Assisted Conception of an Opto-Electronic Illuminator Using a VCSEL and Diffractive Optics

B. Serio, P. Montgomery, P. Twardowski, 2014 .

Spatial resolution optimization of a cooling-down thermal imaging method to reveal hidden academic frescoes

Bruno Serio, Tanguy Davin, Géraldine Guida, 2017 .

Challenges in the areal measurement of surface roughness and shape at the micro and nanoscale

Bruno Serio, Pierre Pfeiffer, F. Anstotz, 2014 .

Solar Energy Management Using a V-Groove: An Approach Based on a Multiple Optical Path Algorithm

B. Serio, G. Guida, M. Hammoud, 2022, Technologies.

Phase correlation method for subpixel in-plane vibration measurements of MEMS by stroboscopic microscopy

Bernard Cretin, Bruno Serio, Jean-Jacques Hunsinger, 2005, SPIE Optical Metrology.

In-plane optical measurement of vibrations of MEMS: gradient methods using interferometry and image processing

Pascal Vairac, Bernard Cretin, Bruno Serio, 2003, SPIE Optical Metrology.

Implementation of a fringe visibility based algorithm in coherence scanning interferometry for surface roughness measurement

Bruno Serio, Pierre Pfeiffer, Fabien Salzenstein, 2013, Optical Metrology.

Modeling of the angular tolerancing of an effective medium diffractive lens using combined finite difference time domain and radiation spectrum method algorithms.

Bruno Serio, Patrick Meyrueis, Victorien Raulot, 2010, Optics express.

Modeling of a diffractive micro-lens by an effective medium method

Bruno Serio, Patrice Twardowski, Victorien Raulot, 2010, Photonics Europe.

Detection of defects in a transparent polymer with high resolution tomography using white light scanning interferometry and noise reduction

P. C. Montgomery, A. Leong-Hoï, B. Serio, 2015, Optical Metrology.

Stroboscopic illumination and synchronous imaging for the characterization of MEMS vibrations

Bernard Cretin, Bruno Serio, Jean-Jacques Hunsinger, 2004, SPIE Photonics Europe.

Anisole fluorescence spectroscopy for temperature measurements with a Hg (Xe) arc lamp excitation

P. Guibert, B. Serio, J. Bonnety, 2017, Experiments in Fluids.

Near-field thermoelastic imaging coupled with infrared detection

B. Cretin, B. Serio, R. Patois, 2004 .

Power transistor near-infrared microthermography using an intensified CCD camera and frame integration

P Meyrueis, Patrick Lagonotte, P. Meyrueis, 2007 .

Three-dimensional surface reconstruction by combining a pico-digital projector for structured light illumination and an imaging system with high magnification and high depth of field

A. Leong-Hoï, B. Serio, P. Twardowski, 2014, Photonics Europe.

Comparison of areal measurements of the same zone of etched Si and hydroxyapatite layers on etched Si using different profiling techniques

Bruno Serio, Pierre Pfeiffer, Paul Montgomery, 2014, Photonics Europe.

Heat Flux Estimation of a Flame Thermal Spray Process Using a Thermally Thin Composite Calorimeter

P. Pfeiffer, S. Costil, B. Serio, 2016, Journal of Thermal Spray Technology.

Short wavelengths active bichromatic pulsed pyrometer for solids and liquids designed for measurements in harsh environments

Julien-Pierre Offret, Jérémy Lebedinsky, Lorris Navello, 2015, Optical Metrology.