G. Sauer

Reaction induced surface segregation in amorphous CuZr, NiZr and PdZr alloys—an XPS and SIMS depth profiling study

A. Wokaun, A. Baiker, M. Kilo, 1996 .

Organic carbon at soil particle surfaces—evidence from x‐ray photoelectron spectroscopy and surface abrasion

W. Amelung, K. Kaiser, G. Sauer, 2002 .

Microdomain Morphology of Thin ABC Triblock Copolymer Films

G. Sauer, G. Krausch, R. Stadler, 1999 .

Characterization of polymeric light emitting diodes by SIMS depth profiling analysis

J. Simmerer, A. Wokaun, D. Haarer, 1995 .