J. Woollam

发表

Interface magnetism and superparamagnetism of Co/Cu multilayers

S. Liou, D. Sellmyer, Z. Shan, 1993 .

Determination of AlAs optical constants by variable angle spectroscopic ellipsometry and a multisample analysis

P. G. Snyder, Y. Kao, C. M. Herzinger, 1995 .

Progress in spectroscopic ellipsometry: Applications from vacuum ultraviolet to infrared

R. Synowicki, C. M. Herzinger, J. Woollam, 2003 .

HEX: Hyperbolic Event eXtractor, a Seismic Phase Associator for Highly Active Seismic Regions

S. Hinz, J. Leitloff, A. Rietbrock, 2020 .

Materials characterization using THz ellipsometry

M. Schubert, T. Hofmann, C. M. Herzinger, 2009 .

Prospects for IR emissivity control using electrochromic structures 1 Presentented at the ICMCTF 97

John A. Woollam, J. Woollam, J. Hale, 1999 .

The process‐controlled magnetic properties of nanostructured Co/Ag composite films

S. Liou, D. Sellmyer, G. Chow, 1991 .

Intercalation Compounds of Molybdenum Disulfide

R. Somoano, J. Woollam, 1979 .

Physics and chemistry of MoS2 intercalation compounds

R. Somoano, J. Woollam, 1977 .

Superconducting critical fields of alkali and alkaline-earth intercalates of MoS2

R. Somoano, J. Woollam, 1976 .

The alkaline earth intercalates of molybdenum disulfide

R. Somoano, J. Woollam, S. Samson, 1975 .

Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation

Craig M. Herzinger, John A. Woollam, B. Johs, 1998 .

Detection of ultrathin biological films using vacuum ultraviolet spectroscopic ellipsometry

John A. Woollam, Greg K. Pribil, Anuradha Subramanian, 2008 .

Thermal characterization of thin films by photothermally induced laser beam deflection

W. McGahan, K. Cole, J. Woollam, 1993 .

Enhancement of magneto-optical Kerr effects

W. McGahan, D. Sellmyer, Liang-yao Chen, 1990 .

Spectroscopic ellipsometry and magneto-optic Kerr effects in Co/Pt multilayers

J. Woollam, D. Thompson, Xiang Gao, 1997 .

De Haas-Shubnikov effect in tungsten

J. Woollam, H. J. Trodahl, 1971 .

Optical and interfacial electronic properties of diamond-like carbon films

D. C. Liu, B. Banks, D. Mathine, 1984 .

Resonant Moke Spectra in Magnetic Layers on Silver

W. McGahan, D. Sellmyer, Z. Shan, 1989 .

ZnSe Coatings for Spacecraft Electrochromic Thermal Control Surfaces

Li Yan, J. Woollam, E. Franke, 2004 .

Superconducting Nb3Ge for high-field magnets

J. Woollam, A. Braginski, M. Daniel, 1978 .

Temperature dependent effective mass in AlGaN/GaN high electron mobility transistor structures

E. Janzén, M. Schubert, T. Hofmann, 2012 .

Invited article: An integrated mid-infrared, far-infrared, and terahertz optical Hall effect instrument.

M. Schubert, T. Hofmann, C. M. Herzinger, 2014, The Review of scientific instruments.

Low Earth Orbit Effects on Indium Tin Oxide and Polyester and Comparison With Laboratory Simulations

R. Synowicki, J. Woollam, N. Ianno, 1993 .

Magnetic and Magneto-Optical Properties of Nanostructured Rare Earth-Transition Metal Multilayered Films

W. McGahan, D. Sellmyer, Z. Shan, 1989 .

Enhanced magneto‐optic Kerr effects in thin magnetic/metallic layered structures

W. McGahan, D. Sellmyer, Liang-yao Chen, 1989 .

Critical currents in Nb 3 Ge based pseudobinaries

S. Alterovitz, J. Woollam, G. Webb, 1979 .

Critical currents and scaling laws in sputtered copper molybdenum sulfide

S. Alterovitz, J. Woollam, H. Luo, 1978 .

Scaling laws for pinning forces in inhomogeneous superconductors

S. Alterovitz, J. Woollam, Samuel A. Alterovitz, 1978 .

Critical currents in sputtered copper molybdenum sulphide

S. Alterovitz, J. Woollam, H. Luo, 1977 .

Determination of optical anisotropy in calcite from ultraviolet to mid-infrared by generalized ellipsometry

John A. Woollam, Daniel W. Thompson, Thomas E. Tiwald, 1998 .

International conference on metallurgical coatings and thin films

P. G. Snyder, P. Bhattacharya, J. Pamulapati, 1991 .

Effects of El Niño on the population dynamics of the Malay civet east of the Wallace line

M. R. Tarrant, B. Gerber, J. Woollam, 2017 .

Variable wavelength, variable angle ellipsometry including a sensitivities correlation test

N. Bashara, J. Woollam, G. H. Bu-abbud, 1986 .

Structural and Chemical Analysis of a Silicon Nitride Film on GaAs by Null Ellipsometry

D. C. Liu, S. Alterovitz, J. Woollam, 1984 .

Thin-Film Ternary Superconductors

S. Alterovitz, J. Woollam, H. Luo, 1982 .

Variable angle spectroscopic ellipsometry - Application to GaAs-AlGaAs multilayer homogeneity characterization

Lester F. Eastman, John A. Woollam, Paul G. Snyder, 1988 .

Materials, Structures, and Devices for High-Speed Electronics

P. G. Snyder, J. Woollam, 1992 .

Characterization of an Asymmetric Triangular Multiple Quantum Well, by Variable Angle Spectroscopic Ellipsometry

D. C. Reynolds, P. G. Snyder, C. E. Stutz, 1989 .

Variable Angle of Incidence Spectroscopic Ellipsometric Measurement of the Franz-Keloysh Effect in Modfet Structures

P. G. Snyder, J. Woollam, J. Oh, 1986 .

Ellipsometric analysis of built‐in electric fields in semiconductor heterostructures

P. G. Snyder, R. E. Owens, J. Woollam, 1987 .

Infrared Ellipsometry – a Novel Tool for Characterization of Group‐III Nitride Heterostructures for Optoelectronic Device Applications

J. Off, M. Schubert, S. Einfeldt, 2001 .

Critical currents in A‐15 structure Nb3Al converted from cold‐worked bcc structure

S. Alterovitz, J. Woollam, G. Webb, 1980 .

Comparison of projected critical currents in PbMo6S8 and Nb3Ge

S. Alterovitz, J. Woollam, 1979 .

Critical current and scaling laws in evaporated two-phase Cu2.5Mo6S8

S. Alterovitz, J. Woollam, 1978 .

Superconducting properties of evaporated copper molybdenum sulfide films

S. Alterovitz, R. Bunshah, J. Woollam, 1978 .

Photoconductive and optical properties of amorphous selenium

J. Woollam, K. R. Morash, B. Averbach, 1971 .

Optical Characterization of Silicon Oxynitride Thin Films by Variable Angle Spectroscopic Ellipsometry

P. G. Snyder, G. Al-Jumaily, J. Woollam, 1992 .

Self-organization in porous 6H-SiC

H. Arwin, J. Woollam, S. Zangooie, 2000 .

Applicability of scaling laws for superconducting critical currents in pseudo-binaries based on Nb3Ge

J. Woollam, Samuel A. Alteeovitz, 1978 .

Enhancing infrared response of adsorbed biomaterials using ellipsometry and textured surfaces

J. Woollam, D. Thompson, 2005 .

Sputtering pressure effect on microstructure of surface and interface, and on coercivity of Co/Pt multilayers

W. McGahan, S. Liou, P. He, 1991 .

Effects of Ion Concentration on Refractive Indices of Fluids Measured by the Minimum Deviation Technique

H. Arwin, J. Woollam, D. Thompson, 2008 .

Optical and magneto-optical constants of MnPt3

S. Jaswal, R. Sabiryanov, R. Kirby, 1997 .

Non-Destructive Evaluation in Manufacturing using Spectroscopic Ellipsometry

P. G. Snyder, J. Woollam, 1991 .

Effects of oxygen “ashing” on indium-tin oxide thin films

Bhola N. De, P. G. Snyder, T. Coutts, 1989 .

Highly oriented Tl2Ba2Ca2Cu3O10 thin films by pulsed laser evaporation

S. Liou, J. Woollam, B. Johs, 1989 .

Spin orbit coupling and energy shifts in single crystal and pyrolytic graphite

J. Woollam, 1971 .

Interactions of amorphous TaxCu1−x (x=0.93 and 0.80) alloy films with Au overlayers and GaAs substrates

J. Woollam, J. Pouch, J. Oh, 1987 .

All-solid-state electrochromic reflectance device for emittance modulation in the far-infrared spectral region

M. Schubert, J. Woollam, J. Hale, 2000 .

Dielectric properties of ‘‘diamondlike’’ carbon prepared by rf plasma deposition

J. Woollam, J. Lamb, 1985 .

Amorphous Hydrogenated “Diamondlike” Carbon Films and Arc-Evaporated Carbon Films

S. Alterovitz, F. Smith, J. Woollam, 1997 .

Degradation of thin films: comparison between low Earth orbit experiments and laboratory simulations of the space environment

R. Synowicki, J. Woollam, A. Moore, 1994 .

Spectroscopic ellipsometry characterization of SiNx antireflection films on textured multicrystalline and monocrystalline silicon solar cells

M. Schubert, J. Woollam, J. Hilfiker, 2010 .

Infrared ellipsometric characterization of silicon nitride films on textured Si photovoltaic cells

M. Schubert, T. Hofmann, J. Woollam, 2008 .

Terahertz Ellipsometry Using Electron-Beam Based Sources

M. Schubert, T. Hofmann, C. M. Herzinger, 2007 .

Mechanical, geometrical, and electrical characterization of silicon membranes for open stencil masks

I. Rangelow, P. Hudek, J. Woollam, 2001 .

Spectroscopic ellipsometric monitoring of electron cyclotron resonance plasma etching of GaAs and AlGaAs

P. G. Snyder, J. Woollam, B. Johs, 1995 .

The Origin of the Berreman Effect in SiC Homostructures

S. Zollner, J. Woollam, J. Carrejo, 1998 .

Electronic properties of Bi2Se3 crystals

J. Woollam, I. Spain, G. R. Hyde, 1974 .

Mobility in single crystal Bi2Se3.

J. Woollam, I. Spain, H. Beale, 1972 .

Screening effects in metal sculptured thin films studied with terahertz Mueller matrix ellipsometry

D. Schmidt, E. Schubert, M. Schubert, 2017 .

Ion beam smoothing of metallic mirrors

P. G. Snyder, D. Ingram, J. Woollam, 1987 .

Study of Ion Implanted Copper Laser Mirrors by Spectroscopic Ellipsometry

P. G. Snyder, D. Ingram, J. Woollam, 1987 .

Films of indium tin oxide (ITO) are ubiquitous in display applications as they combine optical

W. McGahan, J. Woollam, B. Johs, 2016 .

Magnetostriction, thermal expansion, and phase transitions in CsMnCl3 · 2H2O

J. Woollam, G. Butterworth, P. Aron, 1971 .

Thermal and structural stability of cosputtered amorphous Ta(x)Cu(1-x) alloy thin films on GaAs

D. Sellmyer, J. Woollam, J. Pouch, 1986 .

Atomic oxygen effects on thin film space coatings studied by spectroscopic ellipsometry, atomic force microscopy, and laser light scattering

R. Synowicki, J. Woollam, J. Hale, 1992 .

DIRECT EVIDENCE FOR MAJORITY-CARRIER LOCATIONS IN THE BRILLOUIN ZONE OF GRAPHITE.

J. Woollam, 1970 .

Dielectric tensor for magneto-optic NiMnSb Dielectric tensor for magneto-optic NiMnSb

J. Moodera, J. Woollam, Xiang Gao, 2019 .

Ellipsometric, Magneto-Optic, and Magnetic Properties of Sputtered Rare Earth-Transition Metal Multilayers

D. Sellmyer, Z. Shan, J. Woollam, 1987 .

Piezo-optical response of Si1−yCy alloys grown pseudomorphically on Si (001)

S. Iyer, C. M. Herzinger, S. Zollner, 1995 .

Nucleation and Growth of CVD Si Thin Films: AFM, SE and Tem Analysis

W. McGahan, B. Doris, W. Paulson, 1994 .

Elevated temperature dependence of the anisotropic visible-to-ultraviolet dielectric function of monoclinic beta-Ga2O3

M. Schubert, R. Korlacki, J. Woollam, 2017, 1710.10314.

Optical properties of "diamondlike" carbon films: An ellipsometric study

D. Mathine, J. Woollam, A. Khan, 1983 .

Graphite carrier locations and quantum transport to 10 T /100 kG/

J. Woollam, 1971 .

Optical characterization and modeling of amorphous hydrogenated carbon films

W. McGahan, J. Woollam, 1994 .

Low-orbit-environment protective coating for all-solid-state electrochromic surface heat radiation control devices

M. Schubert, Li Yan, J. Woollam, 2002 .

Studies of thin strained InAs, AlAs, and AlSb layers by spectroscopic ellipsometry

P. G. Snyder, Y. Kao, C. M. Herzinger, 1996 .

InP optical constants between 0.75 and 5.0 eV determined by variable‐angle spectroscopic ellipsometry

Craig M. Herzinger, John A. Woollam, Paul G. Snyder, 1995 .

NMR relaxation rate and the libron energy of solid hydrogen

J. Woollam, K. Sugawara, 1978 .

Electronic properties of PbMo6S8 and CuxMo6S8

S. Alterovitz, J. Woollam, 1979 .

Reactively evaporated films of copper molybdenum sulfide

S. Alterovitz, R. Bunshah, J. Woollam, 1978 .

Normal state properties of the ternary molybdenum sulfides

S. Alterovitz, J. Woollam, 1978 .

Optical modeling of Iridium thin film erosion under oxygen plasma exposure

Li Yan, J. Woollam, 2004 .

Infrared optical properties and AFM of spin-cast chitosan films chemically modified with 1,2 Epoxy-3-phenoxy-propane.

A. Subramanian, J. Woollam, S. Sarkar, 2005, Colloids and surfaces. B, Biointerfaces.

Electrical and mechanical properties of copper chloride-intercalated pitch-based carbon fibers

A. Yavrouian, J. Woollam, M. B. Dowell, 1983 .

Metallic conductivity and air stability in copper chloride intercalated carbon fibers

A. Yavrouian, J. Woollam, Hisashi Oshima, 1982 .

Study of Mo-, Au-, and Ni-implanted molybdenum laser mirrors by multiple angle of incidence spectroscopic ellipsometry

P. G. Snyder, D. Aspnes, D. Ingram, 1986 .

Electrical properties of ICl, Br2 and CuCl2 intercalated pitch-based carbon fibers

A. Yavrouian, V. Natarajan, J. Woollam, 1983 .

UV-vis-infrared optical and AFM study of spin-cast chitosan films.

A. Subramanian, J. Woollam, S. Sarkar, 2005, Colloids and surfaces. B, Biointerfaces.

Positive curvature of the Hc2-versus-Tc boundaries in layered superconductors

R. Somoano, J. Woollam, P. O'Connor, 1974 .

Preparation of high Tc Tl‐Ba‐Ca‐Cu‐O thin films by pulsed laser evaporation and Tl2O3 vapor processing

S. Liou, A. Hermann, J. Woollam, 1989 .

Optical properties of RuO2 films deposited by reactive sputtering

J. Woollam, A. Belkind, Z. Orban, 1992 .

In-situ and ex-situ ellipsometric characterization for semiconductor technology (Invited Paper)

John A. Woollam, Paul G. Snyder, Blaine D. Johs, 1992, Other Conferences.

Silicon nitride/silicon oxynitride/silicon dioxide thin film multilayer characterized by variable angle spectroscopic ellipsometry

John A. Woollam, Paul G. Snyder, P. G. Snyder, 1992 .

Fundamentals and applications of variable angle spectroscopic ellipsometry

P. G. Snyder, J. Woollam, 1990 .

Determination of optical constants of silver layers in ZnO/Ag/ZnO coatings using variable angle spectroscopic ellipsometry

J. Woollam, A. Belkind, V. Koss, 1989 .

Determination of the interfacial magneto-optical effects in Co/Pt multilayer structures

J. Woollam, D. Thompson, Xiang Gao, 1997 .

Low temperature normal state resistance of ternary molybdenum sulfides

S. Alterovitz, J. Woollam, 1978 .

Thermopowers and resistivities of silver-palladium and copper-nickel alloys

J. Woollam, P. A. Schroeder, R. Wolf, 1965 .

Indirect measurements of Fermi surface parameters of some Chevrel phase materials

S. Alterovitz, J. Woollam, 1979 .

Evaporated films of superconducting copper molybdenum sulfide

S. Alterovitz, R. Bunshah, D. C. Martin, 1977 .

Magnetic Breakdown and Thermoelectricity in Metallic Tin

J. Woollam, P. A. Schroeder, 1968 .

Hall effect and magnetoresistivity in the ternary molybdenum sulfides

S. Alterovitz, J. Woollam, E. Haugland, 1978 .

Critical currents in sputtered PbMo6S8

S. Alterovitz, J. Woollam, H. Luo, 1978 .

Upper critical field of copper molybdenum sulfide

S. Alterovitz, J. Woollam, 1978 .

Upper critical field of two-phase CuxMo6S8

S. Alterovitz, J. Woollam, 1979 .

Variable angle spectroscopic ellipsometry: A non-destructive characterization technique for ultrathin and multilayer materials☆

P. G. Snyder, J. Woollam, Martin C. Rost, 1988 .

Iridium Metal as Potential Substrates for Experiments in Space

Li Yan, J. Woollam, 2004 .

Optical constants and roughness study of dc magnetron sputtered iridium films

Li Yan, J. Woollam, 2002 .

Use of Raman scattering to investigate disorder and crystallite formation in as-deposited and annealed carbon films

John A. Woollam, R. O. Dillon, J. Woollam, 1984 .

Modeling AlxGa1−xAs optical constants as functions of composition

John A. Woollam, Paul G. Snyder, Blaine D. Johs, 1990 .

Physical and chemical properties of sputter-deposited TaCxNy films

P. Basnyat, S. Aouadi, S. Stadler, 2006, Journal of physics. Condensed matter : an Institute of Physics journal.

Magneto-optical Kerr effect and perpendicular magnetic anisotropy of evaporated and sputtered Co/Pt multilayer structures

P. He, J. Woollam, T. McDaniel, 1991 .

Photoellipsometry: a modulation spectroscopy method applied to n-type GaAs

P. G. Snyder, J. Woollam, Y. Xiong, 1993 .

Photoellipsometry determination of surface Fermi level in GaAs (100)

P. G. Snyder, J. Woollam, Y. Xiong, 1993 .

Thin-film hermeticity - A quantitative analysis of diamondlike carbon using variable angle spectroscopic ellipsometry

S. Alterovitz, D. Ingram, J. Woollam, 1988 .

Kerr effect of two-medium layered systems

John A. Woollam, David J. Sellmyer, William A. McGahan, 1990 .

Magnetic phase diagram of CsMnCl3 · 2H2O

J. Woollam, G. Butterworth, 1969 .

MAGNETISM, DIMENSIONAL CHANGES, AND MAGNETIC TRANSITIONS IN HYDRATED CESIUM MANGANESE CHLORIDE

J. Woollam, P. Aron, 1972 .

Magnetic transitions in CsMnCl3·2H2O studied by magnetostriction and magnetothermal techniques

J. Woollam, G. Butterworth, P. Aron, 1973 .

Optical, spin-resonance, and magnetoresistance studies of /tetrathiatetracene/2/iodide/3 - The nature of the ground state

T. Datta, A. Hermann, M. Novotny, 1978 .

Optical properties of bulk and thin-film SrTiO3 on Si and Pt

John A. Woollam, James N. Hilfiker, Alexander A. Demkov, 2000 .

High-Pressure and Low-Temperature Physics

J. Woollam, C. Chu, 2012 .

Optical characterization of porous alumina from vacuum ultraviolet to midinfrared

P. G. Snyder, Li Yan, J. Woollam, 2005 .

Characterization of polycrystalline silicon thin‐film multilayers by variable angle spectroscopic ellipsometry

P. G. Snyder, Yingfei Xiong, J. Woollam, 1992 .

Controlled index of refraction silicon oxynitride films characterized by variable angle spectroscopic ellipsometry

P. G. Snyder, G. Al-Jumaily, J. Woollam, 1991 .

Variable Angle Spectroscopic Ellipsometric Characterization of Polycrystalline Silicon thin Film Multilayer Structures

P. G. Snyder, J. Woollam, Y. Xiong, 1991 .

Dielectric tensor for magneto-optic NiMnSb

J. Moodera, J. Nowak, D. Sellmyer, 1999 .

Galvanomagnetic effects in graphite—I: Low field data and the densities of free carriers

W. H. Lowrey, J. Woollam, I. Spain, 1978 .

Interfacial effects due to tunneling to insulator gap states in amorphous carbon on silicon metal‐insulator‐semiconductor structures

J. Woollam, A. Khan, Y. Chung, 1984 .

Variable angle of incidence spectroscopic ellipsometry: Application to GaAs‐AlxGa1−xAs multiple heterostructures

John A. Woollam, Paul G. Snyder, Samuel A. Alterovitz, 1986 .

Spectroscopic Ellipsometry and Band Structure of Si 1–y C y Alloys Grown Pseudomorphically on Si (001)

C. M. Herzinger, S. Zollner, K. Eberl, 1995 .

Application of IR variable angle spectroscopic ellipsometry to the determination of free carrier concentration depth profiles

John A. Woollam, Daniel W. Thompson, Thomas E. Tiwald, 1998 .

Which Picker Fits My Data? A Quantitative Evaluation of Deep Learning Based Seismic Pickers

D. Lange, A. Michelini, A. Rietbrock, 2021, Journal of Geophysical Research: Solid Earth.

Analytic solutions for optimized ellipsometric measurements of interfaces and surface layers in thin film structures

S. Alterovitz, J. Woollam, G. H. Bu-abbud, 1985 .

Extension of rotating-analyzer ellipsometry to generalized ellipsometry: determination of the dielectric function tensor from uniaxial TiO 2

Craig M. Herzinger, Mathias Schubert, John A. Woollam, 1996 .

Techniques for ellipsometric measurement of the thickness and optical constants of thin absorbing films

John A. Woollam, Blaine D. Johs, William A. McGahan, 1993 .

Spectroscopic ellipsometry studies of HF treated Si (100) surfaces

S. Alterovitz, J. Woollam, H. Yao, 1993 .

Optical properties of amorphous and polycrystalline tantalum oxide thin films measured by spectroscopic ellipsometry from 0.03 to 8.5 eV

Mathias Schubert, John A. Woollam, Michael J. DeVries, 2001 .

In situ ellipsometry growth characterization of dual ion beam deposited boron nitride thin films

M. Schubert, G. Wagner, J. Woollam, 2000 .

In situ infrared and visible-light ellipsometric investigations of boron nitride thin films at elevated temperatures

Mathias Schubert, John A. Woollam, Daniel W. Thompson, 1998 .

Metal slanted columnar thin film THz optical sensors

D. Schmidt, E. Schubert, M. Schubert, 2012 .

Vacuum ultraviolet optical analysis of spin‐cast chitosan films modified by succinic anhydride and glycidyl phenyl ether

John A. Woollam, Daniel W. Thompson, T. E. Tiwald, 2007 .

Improved apparatus for trapped radical and other studies down to 1.5 K.

J. Woollam, K. Sugawara, 1978, Review of Scientific Instruments.

Oxygen plasma effects on optical properties of ZnSe films

Li Yan, J. Woollam, E. Franke, 2002 .

Optical- and magneto-optical measurements using a variable angle of incidence spectroscopic ellipsometer: Application to DyCo multilayers

Z. Shan, J. Woollam, T. Tiwald, 1989 .

Apparatus for trapping and thermal detection of atomic hydrogen in high magnetic fields at low temperatures

J. Woollam, 1980 .

Carrier concentration and lattice absorption in bulk and epitaxial silicon carbide determined using infrared ellipsometry

John A. Woollam, Stefan Zollner, Thomas E. Tiwald, 1999 .

IR ellipsometry studies of polymers and oxygen plasma-treated polymers

J. Woollam, D. Thompson, C. Bungay, 1998 .

Infrared free carrier response of In0.15Ga0.85As0.17Sb0.83 epilayers on GaSb

P. G. Snyder, Z. Shellenbarger, J. Woollam, 1998 .

Determination of the mid-IR optical constants of water and lubricants using IR ellipsometry combined with an ATR cell

J. Woollam, D. Thompson, S. Pepper, 1998 .

Infrared optical properties of mixed-phase thin films studied by spectroscopic ellipsometry using boron nitride as an example

M. Schubert, F. Richter, J. Woollam, 1997 .

INFRARED ELLIPSOMETRY ON HEXAGONAL AND CUBIC BORON NITRIDE THIN FILMS

M. Schubert, J. Woollam, H. Neumann, 1997 .

Radio-frequency plasma chemical vapor deposition growth of diamond

J. Woollam, R. Dillon, D. Meyer, 1989 .

InP MIS structures with diamondlike amorphous carbon films deposited by ion-beam sputtering and from plasma☆

D. C. Liu, P. G. Snyder, J. Woollam, 1986 .

Surface states at the GaAs-germanium nitride interface

D. Langer, J. Woollam, H. Singh, 1983 .

Giant photoresistivity and optically controlled switching in self-assembled nanowires

John A. Woollam, Daniel W. Thompson, Paul Williams, 2001 .

DIAMONDLIKE CARBON: A BIBLIOGRAPHY OF PUBLISHED PAPERS AND REPORTS.

John A. Woollam, V. Natarajan, J. Woollam, 1986 .

Mass density and hydrogen concentration in “diamond-like” carbon films: Proton recoil, Rutherford backscattering and ellipsometric analysis

D. Ingram, J. Woollam, G. H. Bu-abbud, 1986 .

‘‘Diamondlike’’ carbon films: Optical absorption, dielectric properties, and hardness dependence on deposition parameters

D. C. Liu, V. Natarajan, J. Woollam, 1985 .

Summary Abstract: Optical, Raman, and photoemission results on amorphous ‘‘diamondlike’’ carbon films

D. C. Liu, B. Banks, D. Mathine, 1984 .

Interfacial electrical properties of ion-beam sputter deposited amorphous carbon on silicon

B. Banks, J. Woollam, A. Khan, 1983, IEEE Electron Device Letters.

Bi2Se3 Hall Effect Magnetometer for Reliable Low Temperature Use

J. Woollam, I. Spain, H. Beale, 1973 .

Temperature dependence of optical properties of GaAs

John A. Woollam, Paul G. Snyder, P. G. Snyder, 1991 .

In situ spectroscopic ellipsometry studies of electron cyclotron resonance (ECR) plasma etching of oxides of silicon and GaAs

P. G. Snyder, S. Nafis, J. Woollam, 1993 .

In-Situ Spectroscopic Ellipsometry Applied to ZnSe and ZnCdSe Growth Process in Organometallic Vapor Phase Epitaxy

J. Woollam, B. Johs, J. Iacoponi, 1992 .

Real-Time Analysis Of In-Situ Spectroscopic Ellipsometric Data During Mbe Growth Of III-V Semiconductors

Gerald T. Cooney, K. Shiralagi, G. Maracas, 1991 .

Optical constants of Ga x In 1- x P lattice matched to GaAs

P. G. Snyder, M. Schubert, C. M. Herzinger, 1995 .

Optical constants of GaxIn1−xP lattice matched to GaAs

Craig M. Herzinger, Mathias Schubert, John A. Woollam, 1995 .

Isotropic dielectric functions of highly disordered AlxGa1−xInP (0⩽x⩽1) lattice matched to GaAs

John A. Woollam, Bernd Rheinländer, Volker Gottschalch, 1999 .

Variable-wavelength frequency-domain terahertz ellipsometry.

M. Schubert, T. Hofmann, C. M. Herzinger, 2010, The Review of scientific instruments.

Dielectric function of amorphous tantalum oxide from the far infrared to the deep ultraviolet spectral region measured by spectroscopic ellipsometry

Mathias Schubert, John A. Woollam, Frank Frost, 2000 .

Overview of variable-angle spectroscopic ellipsometry (VASE): II. Advanced applications

John A. Woollam, Corey L. Bungay, James N. Hilfiker, 1999, Optics + Photonics.

Ellipsometric Monitoring of Defects Induced by Electron Cyclotron Resonance Etching of GaAs

P. G. Snyder, J. Woollam, B. Johs, 1995 .

Electron cyclotron resonance etching of semiconductor structures studied by in-situ spectroscopic ellipsometry

P. G. Snyder, W. McGahan, S. Nafis, 1993 .

In Situ Studies of Electron Cyclotron Resonance Plasma Etching of Semiconductors by Spectroscopic Ellipsometry

P. G. Snyder, S. Nafis, J. Woollam, 1992 .

Variable Angle Spectroscopic Ellipsometry (VASE) for the Study of Ion-Beam and Growth-Modified Solids

P. G. Snyder, J. Woollam, Martin C. Rost, 1987 .

Phase and microstructure investigations of boron nitride thin films by spectroscopic ellipsometry in the visible and infrared spectral range

Mathias Schubert, John A. Woollam, Daniel W. Thompson, 1997 .

Quantum limit studies in single crystal and pyrolytic graphite.

D. Sellmyer, J. Woollam, I. Spain, 1972 .

Non-linear extreme quantum limit resistivity in graphite

J. Woollam, 1970 .

Anomalous Galvanomagnetic Properties of Graphite in Strong Magnetic Fields

K. Sugihara, J. Woollam, 1978 .

Temperature and field dependencies of galvanomagnetic effects in graphite

J. Woollam, L. Kreps, 1977 .

Overview of variable-angle spectroscopic ellipsometry (VASE): I. Basic theory and typical applications

Corey L. Bungay, James N. Hilfiker, Ron A. Synowicki, 1999, Optics + Photonics.

3D Local Earthquake Tomography of the Ecuadorian Margin in the Source Area of the 2016 Mw 7.8 Pedernales Earthquake

P. Charvis, M. Ruiz, Y. Font, 2020, Journal of Geophysical Research: Solid Earth.

THz dielectric anisotropy of metal slanted columnar thin films

D. Schmidt, E. Schubert, M. Schubert, 2011 .

Hole diffusion profile in a p-p+ silicon homojunction determined by terahertz and midinfrared spectroscopic ellipsometry

M. Schubert, T. Hofmann, C. M. Herzinger, 2009 .

Infrared switching electrochromic devices based on tungsten oxide

Mathias Schubert, John A. Woollam, E. Franke, 2000 .

Multiple-layered effective medium approximation approach to modeling environmental effects on alumina passivated highly porous silicon nanostructured thin films measured by in-situ Mueller matrix ellipsometry

E. Schubert, M. Schubert, J. Woollam, 2017 .

Spectroscopic ellipsometry studies of indium tin oxide and other flat panel display multilayer materials

J. Woollam, B. Johs, W. A. McGaham, 1994 .

Terahertz ellipsometry and terahertz optical-Hall effect

Tino Hofmann, Craig M. Herzinger, Mathias Schubert, 2011 .

Hole-channel conductivity in epitaxial graphene determined by terahertz optical-Hall effect and midinfrared ellipsometry

Tino Hofmann, Mathias Schubert, John A. Woollam, 2011 .

Behavior of disordered Co-Pd, Co-Ag, and Co-Mo alloys in multilayer interfaces

D. Sellmyer, P. He, Z. Shan, 1993 .

Sputtering pressure effects and temperature‐dependent magnetism of Co/Pd multilayers

Y. Zhang, D. Sellmyer, P. He, 1994 .

Temperature and thickness dependence of coercivity and magnetization of Co/Cu and Co/Si multilayers

D. Sellmyer, Z. Shan, S. Nafis, 1991 .

Nanostructural effects and interface magnetism in Co/Pd multilayers

D. Sellmyer, P. He, Z. Shan, 1993 .

Vacuum ultra-violet spectroscopic ellipsometry study of single- and multi-phase nitride protective films

S. Aouadi, T. Amriou, J. Woollam, 2006, Journal of physics. Condensed matter : an Institute of Physics journal.

Ellipsometric analysis of computer disk structures

P. He, Liang-yao Chen, J. Woollam, 1990 .

Ellipsometric measurements of molecular‐beam‐epitaxy‐grown semiconductor multilayer thicknesses: A comparative study

John A. Woollam, P. P. Pronko, Paul G. Snyder, 1987 .

An enhanced sensitivity null ellipsometry technique for studying films on substrates: Application to silicon nitride on gallium arsenide

John A. Woollam, D. C. Liu, David C. Liu, 1983 .

Comparative Thickness Measurements of Heterojunction Layers by Ellipsometric, RBS, and XTEM Analysis

P. G. Snyder, D. Ingram, J. Woollam, 1986 .

Growth of diamond by rf plasma-assisted chemical vapor deposition

John A. Woollam, Natale J. Ianno, Duane E. Meyer, 1988, Optics & Photonics.

Thermal diffusivity measurements by photothermal laser beam deflection (PTD) : data analysis using the Levenberg-Marquardt algorithm

John A. Woollam, William A. McGahan, W. McGahan, 1992 .

Optical and magneto‐optical characterization of TbFeCo thin films in trilayer structures

John A. Woollam, Ping He, F. Sequeda, 1991 .

In Situ Spectroscopic Ellipsometry for Real Time Semiconductor Growth Monitor

Gerald T. Cooney, P. G. Snyder, G. Maracas, 1990 .

Characterization of Multilayer GaAs/AlGaAs Transistor Structures by Variable Angle Spectroscopic Ellipsometry

John A. Woollam, Paul G. Snyder, Kenneth G. Merkel, 1989 .

Recent developments in spectroscopic ellipsometry for in-situ applications

Craig M. Herzinger, John A. Woollam, Jeff Hale, 2001, SPIE Optics + Photonics.

Properties and performance of fine-filament bronze-process Nb3Sn conductors

R. Schwall, M. Walker, J. Woollam, 1979, IEEE transactions on magnetics.

Ellipsometric analysis of CdZnTe preparation for HgCdTe MBE growth

A. Cornfeld, P. He, J. Benson, 1997 .

In-situ spectroscopic ellipsometry of HgCdTe

John A. Woollam, J. D. Benson, P. R. Boyd, 1996 .

Optical analysis of complex multilayer structures using multiple data types

John A. Woollam, Roger H. French, Franklin D. Kalk, 1994, Other Conferences.

In situ and Ex situ Applications of Spectroscopic Ellipsometry

P. G. Snyder, J. Woollam, H. Yao, 1993 .

Explicit solutions for the optical properties of arbitrary magneto-optic materials in generalized ellipsometry.

M. Schubert, J. Woollam, T. Tiwald, 1999, Applied optics.

Generalized transmission ellipsometry for twisted biaxial dielectric media: Application to chiral liquid crystals

Craig M. Herzinger, Mathias Schubert, John A. Woollam, 1996 .

ELECTRONIC PROPERTIES OF METAL CHLORIDE INTERCALANTS OF GRAPHITE

A. Yavrouian, J. Woollam, M. B. Dowell, 1980 .

Passivating coatings for intercalated graphite fiber electrical conductors

B. Banks, J. Woollam, M. Lake, 1986 .

Infrared optical properties of aged porous GaAs

Mathias Schubert, John A. Woollam, T. E. Tiwald, 2001 .

Magneto-optical and structural properties of BiAlDyIG/Fe multilayers

D. Sellmyer, Yong Zhang, R. Kirby, 1994 .

Pulsed laser deposition of Tl-Ca-Ba-Cu-O films

John A. Woollam, Daniel W. Thompson, Natale J. Ianno, 1990, Defense, Security, and Sensing.

Pulsed Laser Deposition of HTSC Thallium Films

John A. Woollam, Daniel W. Thompson, N. J. Ianno, 1990, Other Conferences.

Pulsed Laser Evaporation of Tl-Ba-Ca-Cu-O Films

S. Liou, J. Woollam, B. Johs, 1989 .

Microstructural characterization of SiOx surface contaminants on ashed aluminum thin films

R. Synowicki, S. Nafis, J. Woollam, 1997 .

Oxygen plasma asher contamination: An analysis of sources and remedies

R. Synowicki, J. Woollam, N. Ianno, 1996 .

Dielectric tensor for interfaces and individual layers in magnetic multilayer structures

J. Woollam, D. Thompson, Xiang Gao, 2000 .

Characterization of UV irradiated space application polymers by spectroscopic ellipsometry

J. Woollam, C. Bungay, T. Tiwald, 2000 .

Spectroscopic Ellipsometry Characterization of Polymers Modified by Atomic Oxygen and Ultraviolet Radiation

K. D. Groh, J. Woollam, C. Bungay, 2001 .

In Situ and Ex Situ Ellipsometric Characterization of Oxygen Plasma and UV Radiation Effects on Spacecraft Materials

J. Woollam, C. Bungay, T. Tiwald, 1997 .

Variable angle of incidence spectroscopic elUpsometric characterization of Ti021 Ag/Ti02 optical coatings

J. Woollam, A. Belkind, K. Memarzadeh, 1988 .

In-situ ellipsometric characterization of the electrodeposition of metal films

J. Woollam, D. Thompson, J. Hilfiker, 1995 .

Process monitoring and control of low temperature reactively sputtered AlN

S. Kirkpatrick, D. Mihut, J. Woollam, 1998 .

ION IRRADIATION SMOOTHING AND FILM BONDING FOR LASER MIRRORS.

B. Appleton, D. Ingram, J. Woollam, 1983 .

Repeatability of ellipsometric data in cholera toxin GM1–ELISA structures

J. Woollam, D. Thompson, T. Tiwald, 2007 .

Graphite minority carriers, from transport measurements to 10 teslas

J. Woollam, 1971 .

Graphite minority carriers

J. Woollam, 1971 .

Minority carriers in graphite.

J. Woollam, 1971 .

Spin Splitting, Fermi Energy Changes, and Anomalous g Shifts in Single-Crystal and Pyrolytic Graphite

J. Woollam, 1970 .

The longitudinal magnetoresistance of graphite ϱzz(Hz) in high magnetic fields

J. Woollam, I. Spain, 1971 .

Quantum galvanomagnetic and thermomagnetic effects in graphite to 18.3 teslas /180 kG/ at low temperatures

J. Woollam, 1971 .

OPTICAL CONSTANTS OF CRYSTALLINE WO3 DEPOSITED BY MAGNETRON SPUTTERING

J. Woollam, D. Thompson, T. Tiwald, 1999 .

Monitoring Organic Thin Film Growth In Aqueous Solution In-situ With A Combined Quartz Crystal Microbalance and Ellipsometry

B. Laderian, M. Schubert, A. Kjerstad, 2008 .

Convolutional Neural Network for Seismic Phase Classification, Performance Demonstration over a Local Seismic Network

Andreas Rietbrock, Jack Woollam, Angel Bueno, 2019, Seismological Research Letters.

Anisotropy and magneto-optical properties of sputtered Co/Ni multilayer thin films

Y. Zhang, D. Sellmyer, Z. Shan, 1994 .

Magnetic and magneto-optic properties of sputtered Co/Ni multilayers

D. Sellmyer, P. He, R. Kirby, 1994 .

Optical determination of shallow carrier profiles using Fourier transform infrared ellipsometry

John A. Woollam, Daniel W. Thompson, Thomas E. Tiwald, 1998 .

High frequency capacitance-voltage and conductance-voltage characteristics of d.c. sputter deposited a-carbon/silicon MIS structures

J. Woollam, A. Khan, Y. Chung, 1984 .

Cubic Silicon Carbide (β-SiC)

S. Alterovitz, J. Woollam, 1997 .

Low-Earth-Orbit Exposure of Carbon-Based Materials Aboard Shuttle Flight STS-46

R. Synowicki, J. Woollam, A. Moore, 1995 .

Thin film materials exposure to low Earth orbit aboard Space Shuttle

R. Synowicki, S. Nafis, J. Woollam, 1995 .

In Situ Ellipsometry in Microelectronics

Eugene A. Irene, J. Woollam, E. Irene, 1995 .

Enhancement of magneto-optical Kerr effects

W. McGahan, D. Sellmyer, Z. Shan, 1990 .

Galvanomagnetic and thermomagnetic effects in white tin in fields to 3.3 tesla and at temperatures between 1.2 and 4.2 K

J. Woollam, 1969 .

Phase and microstructure investigations of boron nitride thin films by spectroscopic ellipsometry in the visible and infrared spectral range

M. Schubert, J. Woollam, H. Neumann, 1997 .

Carbonic anhydrase adsorption in porous silicon studied with infrared ellipsometry

H. Arwin, J. Woollam, D. Thompson, 2005 .

Spectroscopic ellipsometric characterization of Si/Si1−xGex strained-layer supperlattices

S. Alterovitz, M. Tejwani, J. Woollam, 1993 .

Invited article: An integrated mid-infrared, far-infrared, and terahertz optical Hall effect instrument.

T. Hofmann, J. Woollam, P. Kühne, 2014, The Review of scientific instruments.

Infrared response of multiple-component free-carrier plasma in heavily doped p-type GaAs

Mathias Schubert, John A. Woollam, Daniel W. Thompson, 2001 .

Visible and infrared optical constants of electrochromic materials for emissivity modulation applications

John A. Woollam, Michael J. DeVries, J. Woollam, 1998 .

Infrared emittance modulation devices using electrochromic crystalline tungsten oxide, polymer conductor, and nickel oxide

John A. Woollam, Daniel W. Thompson, Thomas E. Tiwald, 1999 .

Infrared spectroscopic ellipsometry for nondestructive characterization of free-carrier and crystal-structure properties of group-III-nitride semiconductor device heterostructures

Mathias Schubert, Sven Einfeldt, Detlef Hommel, 2001, SPIE Optics + Photonics.

Study of surface chemical changes and erosion rates for CV-1144-O silicone under electron cyclotron resonance oxygen plasma exposure

Li Yan, J. Woollam, C. Bungay, 2001 .

Reversible optical structuring of polymer waveguides doped with photochromic molecules

Germano Montemezzani, Peter Günter, F. Diederich, 2000 .