D. Fuard

发表

Rapid mask prototyping for microfluidics.

B. Maisonneuve, T. Honegger, J. Cordeiro, 2016, Biomicrofluidics.

The motility of normal and cancer cells in response to the combined influence of the substrate rigidity and anisotropic microstructure.

J. Ohayon, P. Tracqui, D. Fuard, 2008, Biomaterials.

Optimization of poly-di-methyl-siloxane (PDMS) substrates for studying cellular adhesion and motility

P. Tracqui, D. Fuard, Tzvetelina Tzvetkova-Chevolleau, 2008 .

Etch mechanisms of low dielectric constant polymers in high density plasmas: Impact of charging effects on profile distortion during the etching process

M. Assous, R. Blanc, D. Fuard, 2001 .

High density plasma etching of low k dielectric polymers in oxygen-based chemistries

Marceline Bonvalot, Olivier Joubert, David Fuard, 2001 .

Optimization of Plasma Polymerized Methylsilane process for 248 and 193 nm lithography applications

D. Fuard, O. Joubert, C. Monget, 1999 .

Fabrication of three-dimensional structures for the assessment of cell mechanical interactions within cell monolayers

D. Fuard, D. Peyrade, A. Nicolas, 2010 .

Cells on Hydrogels with Micron-Scaled Stiffness Patterns Demonstrate Local Stiffness Sensing

D. Fuard, A. Nicolas, H. Delanoë-Ayari, 2022, Nanomaterials.

Microscale adhesion patterns for the precise localization of amoeba

E. Yoxall, D. Fuard, Tzvetelina Tzvetkova-Chevolleau, 2009, 0904.1423.

Intracellular stresses in patterned cell assemblies.

D. Fuard, A. Nicolas, H. Delanoë-Ayari, 2013, Soft matter.

Poly-l-lysine/Laminin Surface Coating Reverses Glial Cell Mechanosensitivity on Stiffness-Patterned Hydrogels.

D. Fuard, A. Nicolas, C. Migdal, 2022, ACS applied bio materials.

Assessment of different simplified resist models

Patrick Schiavone, David Fuard, M. Besacier, 2002, SPIE Advanced Lithography.

S-Genius, a universal software platform with versatile inverse problem resolution for scatterometry

David Fuard, Maxime Besacier, Nicolas Troscompt, 2013, Optical Metrology.

Measurement of residual thickness using scatterometry

Patrick Schiavone, David Fuard, Vincent Farys, 2005 .

Hybridization of ellipsometry and energy loss spectra from XPS for bandgap and optical constants determination in SiON thin films

D. B. Cunff, D. Fuard, B. Pélissier, 2021, Materials Chemistry and Physics.

An inverse ellipsometric problem for thin film characterization: comparison of different optimization methods

Jérôme Hazart, Patrick Schiavone, David Fuard, 2009, Advanced Lithography.

Unbiased line width roughness measurements with critical dimension scanning electron microscopy and critical dimension atomic force microscopy

Olivier Joubert, Marc Fouchier, Erwine Pargon, 2012 .

Glial cell mechanosensitivity is reversed by adhesion cues

D. Fuard, C. Tomba, C. Migdal, 2019, bioRxiv.