Cheng-Yu Hu

Investigation on Current Collapse of AlGaN/GaN HFET by Gate Bias Stress

Yasuo Ohno, Jin-Ping Ao, Yuya Yamaoka, 2008, IEICE Trans. Electron..

A Study on Ohmic Contact to Dry-Etched p-GaN

Yasuo Ohno, Jin-Ping Ao, Masaya Okada, 2008, IEICE Trans. Electron..

2D Device Simulation of AlGaN/GaN HFET Current Collapse Caused by Surface Negative Charge Injection

Yasuo Ohno, Jin-Ping Ao, Cheng-Yu Hu, 2010, IEICE Trans. Electron..

Buffer Layer Doping Concentration Measurement Using VT-VSUB Characteristics of GaN HEMT with p-GaN Substrate Layer

Yasuo Ohno, Jin-Ping Ao, Cheng-Yu Hu, 2010, IEICE Trans. Electron..