A. Makarov
发表
W. Goes,
V. Sverdlov,
R. L. De Orio,
2020
.
S. Selberherr,
W. Goes,
V. Sverdlov,
2019,
2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS).
The Exploitation of the Spin-Transfer Torque Effect for CMOS Compatible Beyond Von Neumann Computing
S. Selberherr,
B. Malm,
M. Östling,
2019,
Energy Efficient Computing & Electronics.
S. Selberherr,
V. Sverdlov,
A. Makarov,
2019,
Solid-State Electronics.
S. Selberherr,
V. Sverdlov,
T. Windbacher,
2016
.
S. Selberherr,
J. Ghosh,
V. Sverdlov,
2015
.
S. Selberherr,
J. Ghosh,
V. Sverdlov,
2015
.
S. Selberherr,
V. Sverdlov,
A. Makarov,
2011,
2011 International Conference on Simulation of Semiconductor Processes and Devices.
S. Selberherr,
J. Ghosh,
V. Sverdlov,
2014,
2014 15th International Conference on Ultimate Integration on Silicon (ULIS).
Siegfried Selberherr,
Dmitry Osintsev,
Alexander Makarov,
2011
.
Siegfried Selberherr,
Alexander Makarov,
Viktor Sverdlov,
2012
.
S. Selberherr,
J. Ghosh,
V. Sverdlov,
2015,
2015 30th Symposium on Microelectronics Technology and Devices (SBMicro).
Siegfried Selberherr,
Alexander Makarov,
Viktor Sverdlov,
2010,
2010 International Conference on Simulation of Semiconductor Processes and Devices.
S. Selberherr,
V. Sverdlov,
A. Makarov,
2010
.
S. Selberherr,
V. Sverdlov,
A. Makarov,
2018,
2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
A. De Keersgieter,
A. Chasin,
D. Linten,
2021,
Microelectronics Reliability.
T. Grasser,
B. Kaczer,
J. Franco,
2018
.
T. Grasser,
B. Kaczer,
J. Franco,
2017,
IEEE Electron Device Letters.
On the effect of interface traps on the carrier distribution function during hot-carrier degradation
T. Grasser,
B. Kaczer,
J. Franco,
2016,
2016 IEEE International Integrated Reliability Workshop (IIRW).
S. Selberherr,
W. Goes,
V. Sverdlov,
2020
.
D. Linten,
A. Spessot,
B. Kaczer,
2020,
Micromachines.
A. De Keersgieter,
A. Chasin,
D. Linten,
2020,
2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
A. Chasin,
D. Linten,
T. Grasser,
2019,
IEEE Electron Device Letters.
D. Linten,
A. Spessot,
B. Kaczer,
2019,
2019 IEEE International Integrated Reliability Workshop (IIRW).
T. Grasser,
G. Rzepa,
G. Pobegen,
2018,
2018 International Integrated Reliability Workshop (IIRW).
S. Selberherr,
V. Sverdlov,
A. Makarov,
2012,
2012 15th International Workshop on Computational Electronics.
S. Selberherr,
V. Sverdlov,
A. Makarov,
2018
.
S. Selberherr,
V. Sverdlov,
A. Makarov,
2012
.
S. Selberherr,
V. Sverdlov,
V. Sverdlov,
2014,
2014 International Workshop on Computational Electronics (IWCE).
H. Mertens,
A. Chasin,
B. Kaczer,
2022,
2022 IEEE International Reliability Physics Symposium (IRPS).
S. Selberherr,
V. Sverdlov,
J. Weinbub,
2017
.
A. Makarov,
S. Tyaginov,
M. Vexler,
2022,
Physical Review Materials.
S. Selberherr,
A. Makarov,
V. Sverdlov,
2014,
2014 29th International Conference on Microelectronics Proceedings - MIEL 2014.
S. Selberherr,
V. Sverdlov,
A. Makarov,
2013
.
S. Selberherr,
V. Sverdlov,
A. Makarov,
2011,
2011 International Semiconductor Device Research Symposium (ISDRS).
Siegfried Selberherr,
Dmitry Osintsev,
Alexander Makarov,
2011,
Large-Scale Scientific Computing.
S. Selberherr,
V. Sverdlov,
A. Makarov,
2011,
Ulis 2011 Ultimate Integration on Silicon.
Siegfried Selberherr,
Thomas Windbacher,
Oliver Triebl,
2013
.
A. Chasin,
B. Kaczer,
G. Groeseneken,
2023,
IEEE Electron Device Letters.
S. Selberherr,
V. Sverdlov,
A. Makarov,
2014
.
S. Selberherr,
A. Makarov,
V. Sverdlov,
2012,
2012 28th International Conference on Microelectronics Proceedings.
Siegfried Selberherr,
Alexander Makarov,
Viktor Sverdlov,
2012,
Microelectron. Reliab..
Siegfried Selberherr,
Dmitry Osintsev,
Alexander Makarov,
2012,
IEEE Transactions on Magnetics.
S. Selberherr,
A. Makarov,
V. Sverdlov,
2012,
2012 8th International Caribbean Conference on Devices, Circuits and Systems (ICCDCS).
S. Selberherr,
A. Makarov,
V. Sverdlov,
2011,
2011 IEEE International Conference of Electron Devices and Solid-State Circuits.
S. Selberherr,
V. Sverdlov,
A. Makarov,
2011,
2011 International Semiconductor Device Research Symposium (ISDRS).
Siegfried Selberherr,
Alexander Makarov,
Viktor Sverdlov,
2012
.
S. Selberherr,
V. Sverdlov,
J. Weinbub,
2011
.
S. Selberherr,
V. Sverdlov,
A. Makarov,
2011
.
Siegfried Selberherr,
Thomas Windbacher,
Alexander Makarov,
2015,
2015 15th Non-Volatile Memory Technology Symposium (NVMTS).
A. Chasin,
B. Kaczer,
G. Eneman,
2022,
2022 IEEE International Reliability Physics Symposium (IRPS).
Siegfried Selberherr,
Alexander Makarov,
Viktor Sverdlov,
2011
.
S. Selberherr,
V. Sverdlov,
A. Makarov,
2010,
2010 14th International Workshop on Computational Electronics.
S. Selberherr,
V. Sverdlov,
A. Makarov,
2010,
2010 Proceedings of the European Solid State Device Research Conference.
Siegfried Selberherr,
Alexander Makarov,
Viktor Sverdlov,
2010,
NMA.
S. Selberherr,
V. Sverdlov,
A. Makarov,
2010,
2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.
S. Selberherr,
V. Sverdlov,
J. Weinbub,
2010
.
Dimitri Linten,
Geert Hellings,
Tibor Grasser,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
Siegfried Selberherr,
Alexander Makarov,
Viktor Sverdlov,
2018,
2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS).
S. Selberherr,
V. Sverdlov,
T. Windbacher,
2016,
2016 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
Dimitri Linten,
Geert Hellings,
Philippe Roussel,
2019,
IEEE Electron Device Letters.
Dimitri Linten,
Guido Groeseneken,
Ben Kaczer,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
Dimitri Linten,
Guido Groeseneken,
Ben Kaczer,
2018,
2018 International Integrated Reliability Workshop (IIRW).
Prateek Sharma,
Tibor Grasser,
Jacopo Franco,
2016,
2016 46th European Solid-State Device Research Conference (ESSDERC).
H. Mertens,
A. Chasin,
B. Kaczer,
2023,
IEEE International Reliability Physics Symposium.
T. Grasser,
M. Waltl,
G. Rzepa,
2020,
2020 IEEE International Integrated Reliability Workshop (IIRW).
T. Grasser,
B. Kaczer,
J. Franco,
2018
.
A. Chasin,
D. Linten,
T. Grasser,
2018,
Semiconductors.
A. De Keersgieter,
A. Chasin,
D. Linten,
2019,
2019 IEEE International Electron Devices Meeting (IEDM).
B. Kaczer,
T. Grasser,
G. Hellings,
2017,
2017 IEEE International Electron Devices Meeting (IEDM).
H. Mertens,
A. Chasin,
D. Linten,
2019
.
S. Selberherr,
V. Sverdlov,
T. Windbacher,
2015
.
S. Selberherr,
V. Sverdlov,
A. Makarov,
2012
.
S. Selberherr,
V. Sverdlov,
T. Windbacher,
2016
.
Siegfried Selberherr,
Thomas Windbacher,
Alexander Makarov,
2016,
NanoScience + Engineering.
Siegfried Selberherr,
Thomas Windbacher,
Alexander Makarov,
2016,
2016 46th European Solid-State Device Research Conference (ESSDERC).
S. Selberherr,
V. Sverdlov,
T. Windbacher,
2015,
2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
Siegfried Selberherr,
Alexander Makarov,
Viktor Sverdlov,
2015
.
Siegfried Selberherr,
Thomas Windbacher,
Alexander Makarov,
2013
.
A. De Keersgieter,
A. Chasin,
A. Spessot,
2023,
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).
B. Kaczer,
A. Afzalian,
G. Hellings,
2022,
2022 IEEE International Reliability Physics Symposium (IRPS).
Dimitri Linten,
Geert Hellings,
Ben Kaczer,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).