Xiaodi Xu
发表
Danyu Wu,
Lei Zhou,
Xinyu Liu,
2020
.
Investigating the impact of the defect dynamic characteristics on the PBTI in the high-κ gate device
Chenjie Gu,
Weiwei Wang,
Wenjun Liu,
2018,
Microelectron. Reliab..
Xiaodi Xu,
Yan Shen,
Shuai Han,
2023,
Applied Sciences.