C. Leroux
发表
T. Ernst,
D. Lafond,
T. Baron,
2012
.
V. Pierron-Bohnes,
G. Inden,
C. Leroux,
1988
.
C-M. V. Lu,
A. Toffoli,
T. Skotnicki,
2017,
2017 Symposium on VLSI Technology.
A. Poncet,
C. Leroux,
L. Militaru,
2005
.
Gerard Ghibaudo,
Thomas Ernst,
Carlotta Guiducci,
2003
.
S. Maitrejean,
F. Martin,
R. Gassilloud,
2014
.
J. Cluzel,
M. Charles,
G. Ghibaudo,
2020,
IEEE Transactions on Electron Devices.
R. Gassilloud,
C. Vallée,
C. Leroux,
2014
.
G. Ghibaudo,
C. Leroux,
C. Suarez-Segovia,
2017,
IEEE Electron Device Letters.
G. Ghibaudo,
C. Le Royer,
M. Jaud,
2021,
Journal of Applied Physics.
M. Charles,
G. Ghibaudo,
G. Reimbold,
2019,
Microelectronic Engineering.
C. Morin,
J. Hartmann,
T. Ernst,
2011
.
G. Ghibaudo,
T. Ernst,
A. Szewczyk,
2001,
31st European Solid-State Device Research Conference.
G. Reimbold,
Gerard Ghibaudo,
A. Toffoli,
2011
.
G. Ghibaudo,
G. Reimbold,
C. Leroux,
2018
.
G. Ghibaudo,
G. Reimbold,
C. Leroux,
2017
.
A. Toffoli,
G. Ghibaudo,
F. Allain,
2007
.
S. Lhostis,
E. Martinez,
C. Licitra,
2009
.
Reliable extraction of metal gate work function by combining two electrical characterization methods
G. Ghibaudo,
G. Reimbold,
J. Mitard,
2007,
ESSDERC 2007 - 37th European Solid State Device Research Conference.
R. Revel,
S. Royer,
C. Leroux,
2006
.
G. Ghibaudo,
C. Leroux,
Pushpendra Kumar,
2019,
MRS Advances.
Y. Schuurman,
C. Chizallet,
C. Leroux,
2018
.
G. Molas,
A. Toffoli,
H. Grampeix,
2006,
2006 International Electron Devices Meeting.
Annick Loiseau,
C. Leroux,
D. Broddin,
1991
.
C. Leroux,
M. Cadeville,
V. Pierron-Bonnes,
1986
.
X. Garros,
J. Autran,
C. Leroux,
2002
.
Pascal Masson,
Michel Houssa,
Xavier Garros,
2002
.
Annick Loiseau,
G. V. Tendeloo,
C. Leroux,
1990
.
V. Pierron-Bohnes,
A. Menelle,
P. Bastie,
1989
.
M. Charles,
G. Reimbold,
E. Bano,
2017
.
C. Leroux,
M. Cadeville,
J. Morán-López,
1989
.
C. Leroux,
M. Cadeville,
J. Morán-López,
1988
.
L. Tanner,
D. Schryvers,
G. Tendeloo,
1990
.
Annick Loiseau,
G. V. Tendeloo,
C. Leroux,
1990
.
Gilles Reimbold,
Christophe Licitra,
Charles Leroux,
2010,
IEEE Transactions on Electron Devices.
M. Charles,
J. Barnes,
C. Leroux,
2019,
Journal of Crystal Growth.
Gilles Reimbold,
Charles Leroux,
Gérard Ghibaudo,
2007,
Microelectron. Reliab..
G. Ghibaudo,
X. Garros,
G. Reimbold,
2006
.
Jerome Mitard,
Charles Leroux,
François Martin,
2006
.
J. Mitard,
Gilles Reimbold,
Transcients Modeling,
2005
.
Gilles Reimbold,
D. Blachier,
Charles Leroux,
1997
.
C. Alfonso,
C. Leroux,
A. Charaï,
2010,
Ultramicroscopy.
B. De Salvo,
E. Augendre,
A. Emboras,
2012,
Optics express.
G. Ghibaudo,
G. Reimbold,
R. Clerc,
2001
.
M. Charles,
G. Ghibaudo,
E. Bano,
2023,
Journal of Electronics and Electrical Engineering.
C. Leroux,
M. Cadeville,
R. Kozubski,
1989
.
C. Leroux,
P. Crevel,
J.P. Chante,
1998,
Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347).
M. Mouis,
M. Cassé,
G. Reimbold,
2007
.
D. Blachier,
Charles Leroux,
C. Leroux,
1999
.
B. De Salvo,
E. Augendre,
A. Emboras,
2012,
Optics express.
Interface states in HfO/sub 2/ stacks with metal gate: nature, passivation, generation [MOS devices]
X. Garros,
G. Reimbold,
C. Leroux,
2005,
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
R. Revel,
S. Royer,
A. Chaumonnot,
2007
.