Yuqiong Chu

The Demonstration of High-Performance Multilayer BaTiO3/BiFeO3 Stack MIM Capacitors

C. Hsieh, M. Liao, C. Lien, 2018, IEEE Transactions on Electron Devices.

Charge Loss Characteristics of Different Al Contents in a HfAlO Trapping Layer Investigated by Variable Temperature Kelvin Probe Force Microscopy

Meilin Liu, Baohe Yang, Guoxing Chen, 2014 .