C. Wang

Characterization and comparison of high-k metal-insulator-metal (MiM) capacitors in 0.13 /spl mu/m Cu BEOL for mixed-mode and RF applications

C. Tsai, J. Sun, Y. Tu, 2003, 2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407).

The Impact of Gate Edge Damage on Pixel Read Noise

S. F. Ting, Jhy-Jyi Sze, S. Ting, 2013 .