C. Jung

Review of plane grating focusing for soft x‐ray monochromators

W. Peatman, H. Petersen, C. Jung, 1995 .

First results of the soft X-ray microfocus beamline U41-PGM

R. Follath, F. Eggenstein, F. Senf, 2001 .

A new method for the calibration of the vertical scale of a stylus profilometer using multiple delta-layer films

Kyung Joong Kim, K. Kim, C. Jung, 2007 .