Bill Dauksher

Further Studies on the Effect of SiNx Refractive Index and Emitter Sheet Resistance on Potential-Induced Degradation

G. Tamizhmani, S. Bowden, P. Hacke, 2017, IEEE Journal of Photovoltaics.

A novel technique for performing PID susceptibility screening during the solar cell fabrication process

G. Tamizhmani, S. Bowden, P. Hacke, 2016, 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC).

Determination of charged state density at the interface between amorphous silicon and crystalline silicon by lateral conductance

C. Tracy, C. Honsberg, S. Bowden, 2010, 2010 35th IEEE Photovoltaic Specialists Conference.

Characterization and comparison of silicon nitride films deposited using two novel processes

Barry P. O'Brien, C. Tracy, S. Bowden, 2011, 2011 37th IEEE Photovoltaic Specialists Conference.

Extendibility of x‐ray lithography to ⩽130 nm ground rules in complex integrated circuit patterns

J. Maldonado, K. Cummings, F. Cerrina, 1996 .

p+ Emitters on n-Type c-Si dry-etched with nitrogen trifluoride and passivated with ALD aluminum oxide

Mark S. Bailly, C. Tracy, S. Bowden, 2014, 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC).

A novel technique for performing PID susceptibility screening during the solar cell fabrication process

G. Tamizhmani, S. Bowden, P. Hacke, 2017, 2017 IEEE 44th Photovoltaic Specialist Conference (PVSC).