J. D’Amico

Further Studies on the Effect of SiNx Refractive Index and Emitter Sheet Resistance on Potential-Induced Degradation

G. Tamizhmani, S. Bowden, P. Hacke, 2017, IEEE Journal of Photovoltaics.

Study of Stress-Induced Leakage Current in Thin Oxides Stressed by Corona Charging in Air: Relationship to GOI Defects

D. Marinskiy, J. D’Amico, L. Jastrzebski, 1999 .

Accelerated Light-Induced Degradation (ALID) for Monitoring of Defects in PV Silicon Wafers and Solar Cells

J. D’Amico, Marshall Wilson, P. Edelman, 2010 .

Review—Recent Advancement in Charge- and Photo-Assisted Non-Contact Electrical Characterization of SiC, GaN, and AlGaN/GaN HEMT

F. Horikiri, J. D’Amico, Marshall Wilson, 2017 .

Pioneering Application of Corona Charge-Kelvin Probe Metrology to Noncontact Characterization of In 0.53 Ga 0.47 As/Al 2 O 3 /HfO 2 Stack

G. Bersuker, D. Veksler, Tae-Woo Kim, 2014 .

Multifunction metrology platform for photovoltaics

R. Kopecek, K. Peter, J. D’Amico, 2011, 2011 37th IEEE Photovoltaic Specialists Conference.

Non-contact C-V measurements of ultra thin dielectrics

D. Marinskiy, J. D’Amico, Marshall Wilson, 2004 .

Non‐Contact Electrical Doping Profiling

D. Marinskiy, J. D’Amico, L. Jastrzebski, 2003 .