M. Shroff

Model based method for electro-migration stress determination in interconnects

E. Demircan, M. Shroff, 2014, 2014 IEEE International Reliability Physics Symposium.

Attrition of precipitated iron Fischer-Tropsch catalysts

A. Datye, M. Shroff, N. B. Jackson, 1995 .

Data analytics and machine learning: root-cause problem-solving approach to prevent yield loss and quality issues in semiconductor industry for automotive applications

M. Shroff, C. Bergès, J. Bird, 2021, 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

The importance of passivation in the study of iron Fischer-Tropsch catalysts

Mehul D. Shroff, A. Datye, M. Shroff, 1996 .

Activation of Precipitated Iron Fischer-Tropsch Synthesis Catalysts

Abhaya K. Datye, Allen G. Sault, Mehul D. Shroff, 1995 .

Fast Electromigration Stress Evolution Analysis for Interconnect Trees Using Krylov Subspace Method

Sheldon X.-D. Tan, Ertugrul Demircan, Zeyu Sun, 2018, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

Voltage-based electromigration immortality check for general multi-branch interconnects

Sheldon X.-D. Tan, Taeyoung Kim, Zeyu Sun, 2016, 2016 IEEE/ACM International Conference on Computer-Aided Design (ICCAD).

A Novel Biasing Technique for Addressable Parametric Arrays

B. Smith, V. Kolagunta, A. Arriordaz, 2008, IEEE Transactions on Semiconductor Manufacturing.