Young-Joon Park
发表
A Variable Current Exponent Model for Electromigration Lifetime Relaxation in Short Cu Interconnects
W. Hunter,
Ki-Don Lee,
Young-Joon Park,
2006,
2006 International Electron Devices Meeting.
S. Krishnan,
J. Joh,
Young-Joon Park,
2020,
2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD).
Young‐Chang Joo,
N. Hwang,
Young-Joon Park,
2001
.
H. J. Kim,
Young-Joon Park,
Hyoungsu Kim,
2000
.
Y. Baik,
Young-Joon Park,
1999,
Metals and Materials.
S. Krishnan,
J. Joh,
Young-Joon Park,
2018,
2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD).
Young-Joon Park,
Ki-Don Lee,
Ki-Don Lee,
2005,
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
V. T. Srikar,
Young-Joon Park,
Carl V. Thompson,
1999
.
Young-Joon Park,
Jungwoo Joh,
J. Joh,
2014,
2014 IEEE International Reliability Physics Symposium.
Young‐Chang Joo,
Young-Joon Park,
2001
.
Young-Joon Park,
Carl V. Thompson,
V. K. Andleigh,
1999
.
Young‐Chang Joo,
Jong-Min Paik,
Je‐hun Lee,
2003
.
Jong-Wan Park,
Y. Baik,
K. Eun,
2000
.
Young‐Chang Joo,
N. Hwang,
Young-Joon Park,
2005
.
Young‐Chang Joo,
I. Choi,
Young-Joon Park,
2002
.
Young‐Chang Joo,
I. Choi,
Young-Joon Park,
2000
.
Young‐Chang Joo,
N. Hwang,
Young-Joon Park,
2002
.
Young‐Chang Joo,
N. Hwang,
Young-Joon Park,
2002
.
Young-Joon Park,
Jae-Bong Lee,
Yuna Lee,
2002
.
Young‐Chang Joo,
N. Hwang,
Young-Joon Park,
2004
.