H. Sudo

Observation of the surface degradation mode of InP/InGaAs APD's during bias-temperature test

H. Sudo, M. Suzuki, N. Miyahara, 1987, IEEE Electron Device Letters.

Surface degradation mechanism of InP/InGaAs APDs

H. Sudo, M. Suzuki, 1988 .

Reliability of semiconductor lasers and detectors for undersea transmission systems

Y. Nakano, T. Ikegami, H. Sudo, 1984 .

Surface degradation mechanism of InP/InGaAs APDs

Norio Miyahara, Masamitsu Suzuki, Hiromi Sudo, 1988 .

Strained-layer InGaAs/InGaAsP MQW structures and their application to 1.67 μm lasers grown by metalorganic vapor phase epitaxy

Mitsuo Yamamoto, Hiromi Sudo, Nobuyori Tsuzuki, 1991 .

Reliability of Semiconductor Lasers and Detectors for Undersea Transmission Systems

Tadashi Matsumoto, Tetsuhiko Ikegami, Hiromi Sudo, 1984, IEEE J. Sel. Areas Commun..