P. Tüttö

Charge motion in silicon MOS structures

M. Németh-Sallay, R. Szabo, I. Szép, 1980 .

In situ bulk lifetime measurement on silicon with a chemically passivated surface

P. Tüttö, T. Pavelka, T. Horányi, 1993 .

Improved method for depth profiling of multilayer structures

P. Tüttö, G. Endrédi, T. Horányi, 1991 .

Improved accuracy of eddy-current sensor based carrier lifetime measurement using laser excitation

P. Tüttö, G. Paráda, F. Korsós, 2022, EPJ Photovoltaics.

Electrochemical etching and profiling of silicon

P. Tüttö, T. Horányi, 1993 .