B. Yun

发表

Charge injection from polycrystalline silicon into SiO2 at low fields

T. W. Hickmott, B. Yun, 1977 .

Direct display of electron back tunneling in MNOS memory capacitors

B. Yun, B. H. Yun, 1973 .

Electron and hole transport in CVD Si3N4 films

B. Yun, 1975 .

Improved oxide of metal‐oxide‐silicon capacitors resulting from backsurface argon implantation

B. Yun, 1981 .

Measurements of charge propagation in Si3N4 films

B. Yun, B. H. Yun, 1974 .

Silicon nitride trap properties as revealed by charge−centroid measurements on MNOS devices

P. Arnett, B. Yun, P. Arnett, 1975 .