B. Mcdonald

Ionic contamination-induced degradation of low current hFE

B. Mcdonald, 1971 .

Avalanche degradation of h FE

B. Mcdonald, 1969 .

Avalanche Effects in Silicon p—n Junctions. II. Structurally Perfect Junctions

A. Goetzberger, R. M. Scarlett, R. H. Haitz, 1963 .

Measurement of the Depth of Diffused Layers in Silicon by the Grooving Method

A. Goetzberger, B. Mcdonald, 1962 .

Avalanche degradation of h FE

B. Mcdonald, 1969 .

Degradation of h FE at moderate current levels

B. Mcdonald, 1971 .