Y. Pan
发表
K. Ng,
Y. Pan,
C. Wei,
1994,
IEEE Electron Device Letters.
D. Chan,
W. Chim,
Y. Pan,
1997
.
D. Chan,
W. Chim,
Y. Pan,
1997,
IEEE Electron Device Letters.
K. Ng,
Y. Pan,
V. Kwong,
1994
.
Y. Pan,
Y. Pan,
1994
.
Y. Pan,
1993
.
K. Ng,
Y. Pan,
V. Kowng,
1994
.
K. Ng,
Y. Pan,
V. Kwong,
1994
.
D. Chan,
W. Chim,
Y. Pan,
1997
.
D. Chan,
W. Chim,
Y. Pan,
1995,
Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
C. Kleijn,
S. Kenjereš,
I. Richardson,
2010
.
Hot-carrier reliability of n- and p- channel MOSFETS with polysilicon and CVD tungsten-polycide gate
D. Chan,
Y. Pan,
C. Lou,
1996,
Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis.
D. Chan,
W. Chim,
Y. Pan,
1996
.
Y. Pan,
M. Kleefstra,
1990
.
S. Jain,
P. Balk,
Y. Pan,
1992
.
Y. Pan,
1992
.
Y. Pan,
1991
.
Y. Pan,
1990
.
Y. Pan,
C. Lou,
D.S.H. Chan,
1995,
Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits.