R. Liou

Time-Dependent Drain- and Source-Series Resistance of High-Voltage Lateral Diffused Metal–Oxide–Semiconductor Field-Effect Transistors during Hot-Carrier Stress

J. Gong, Shih-hui Chen, Meng-chyi Wu, 2003 .

RESURF Model and Electrical Characteristics of Finger-Type STI Drain Extended MOS Transistors

C. Lien, R. Liou, Hung-Chih Tsai, 2016, IEEE Transactions on Electron Devices.

Breakdown Voltage Model and Electrical Characteristics of CMOS Compatible RESURF STI Drain Extended MOS Transistors

C. Lien, R. Liou, Kuo-Ming Wu, 2015, IEEE Transactions on Electron Devices.

The Study of the Electrothermal Property of High-Voltage Drain-Extended MOSFETs

H. Tuan, J. Gong, Chih-Fang Huang, 2012, IEEE Transactions on Electron Devices.

Investigation of voltage-dependent drift region resistance on high-voltage drain-extended MOSFETs' I-V characteristics

H. Tuan, J. Gong, Chih-Fang Huang, 2012 .

High voltage NPN-bipolar transistor using P/sup +/-buried layer in BiCMOS process

J. Gong, Shih-hui Chen, Jei-feng Huang, 1999 .

The Effect of Self-Heating in LDMOSFET Expansion Regime

H. Tuan, J. Gong, Chih-Fang Huang, 2012, IEEE Transactions on Electron Devices.

A 700-V Device in High-Voltage Power ICs With Low On-State Resistance and Enhanced SOA

Jeng Gong, Chih-Fang Huang, Chun-Lin Tsai, 2013, IEEE Transactions on Electron Devices.