F. Bauwens

发表

M. Tack, P. Moens, J. Mertens, 2007, 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.

M. Tack, P. Moens, F. Bauwens, 2005, 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..

G. Van den bosch, P. Moens, F. Bauwens, 2005, Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005..

X. Jordà, M. Vellvehí, M. Tack, 2017, 2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD).

X. Jordà, M. Vellvehí, M. Tack, 2017, IEEE Electron Device Letters.

Jaume Roig, Filip Bauwens, F. Bauwens, 2015, IEEE Transactions on Electron Devices.

Diego G. Lamar, Jaume Roig, Filip Bauwens, 2019, IEEE Transactions on Power Electronics.

B. Desoete, M. Tack, P. Moens, 2009, 2009 IEEE International Reliability Physics Symposium.

I. De Wolf, M. Tack, P. Moens, 2007, 2007 IEEE International Electron Devices Meeting.

M. Tack, P. Moens, F. Bauwens, 2006, 2006 International Electron Devices Meeting.

F. Bauwens, V. Ponomarev, L. Govor, 1998 .

J. Heyse, F. Bauwens, W. Mondelaers, 2000 .

V. Werner, F. Bauwens, N. Pietralla, 1999, nucl-ex/9906003.

F. Bauwens, L. Govor, W. Mondelaers, 1998 .

P. Moens, F. Bauwens, M. Thomason, 2005, Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005..

P. Moens, F. Bauwens, B. Vlachakis, 2004, IEEE Electron Device Letters.

Filip Bauwens, Peter Moens, Marnix Tack, 2014 .

Filip Bauwens, Marnix Tack, Xavier Jordà, 2017, IEEE Transactions on Industrial Electronics.

M. Tack, P. Moens, J. Baele, 2007, Proceedings of the 19th International Symposium on Power Semiconductor Devices and IC's.

P. Gassot, M. Tack, P. Moens, 2014, 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD).

Filip Bauwens, Jaume Roig, J. Lebon, 2012, Microelectron. Reliab..

Jaume Roig, Filip Bauwens, Renaud Gillon, 2014, 2014 IEEE Applied Power Electronics Conference and Exposition - APEC 2014.