P. Tounsi
发表
J. Dorkel,
H. Dia,
P. Tounsi,
2010,
2010 16th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC).
P. Tounsi,
J. Reynes,
S. Sanchez,
2020
.
H. Schneider,
P. Tounsi,
Z. Zhang,
2012
.
J. Dorkel,
P. Tounsi,
J. Reynes,
2011,
ICM 2011 Proceeding.
P. Tounsi,
J. Reynes,
J. Fradin,
2019,
2019 IEEE 13th International Conference on Power Electronics and Drive Systems (PEDS).
P. Tounsi,
A. Hneine,
J. L. Massou,
2011
.
J. Dorkel,
A. Bourennane,
P. Tounsi,
2009,
2009 MIXDES-16th International Conference Mixed Design of Integrated Circuits & Systems.
W. Habra,
P. Tounsi,
J.-M. Dorkel,
2005,
EuroSimE 2005. Proceedings of the 6th International Conference on Thermal, Mechanial and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2005..
Patrick Tounsi,
Alexandre Boyer,
Nabil El Belghiti Alaoui,
2018,
Microelectron. Reliab..
Patrick Tounsi,
A. Bourennane,
Marie Breil,
2012,
Microelectron. Reliab..
Marc Legros,
Patrick Tounsi,
Benjamin Khong,
2007,
Microelectron. Reliab..
X. Chauffleur,
P. Tounsi,
J.M. Dorkel,
2004,
Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545).
Patrick Tounsi,
A. Deram,
Jean-Baptiste Sauveplane,
2008,
Microelectron. Reliab..
Philippe Dupuy,
Patrick Tounsi,
Jean-Marie Dorkel,
2011,
Microelectron. Reliab..
Patrick Tounsi,
Jean-Marie Dilhac,
Romain Monthéard,
2014,
Journal of Electronic Materials.
Patrick Tounsi,
Marie Breil,
Jean-Marie Dorkel,
2014
.
Patrick Tounsi,
Jean-Marie Dorkel,
Jean-Michel Reynes,
2014,
IEEE Transactions on Device and Materials Reliability.
Patrick Tounsi,
Alexandre Boyer,
Nabil El Belghiti Alaoui,
2019,
Microelectronics Reliability.