C. Contiero

Hot-carrier reliability in submicrometer LDMOS transistors

B. Riccò, R. Versari, A. Pieracci, 1997, International Electron Devices Meeting. IEDM Technical Digest.

Hot-electron injection and trapping in the gate oxide of submicron DMOS transistors

S. Manzini, C. Contiero, A. Gallerano, 1998, Proceedings of the 10th International Symposium on Power Semiconductor Devices and ICs. ISPSD'98 (IEEE Cat. No.98CH36212).

Roadmap Differentiation and Emerging Trends in BCD Technology

C. Contiero, P. Galbiati, A. Andreini, 2002, 32nd European Solid-State Device Research Conference.

Smart power technologies evolution

S. Sueri, C. Contiero, A. Russo, 2000, Conference Record of the 2000 IEEE Industry Applications Conference. Thirty-Fifth IAS Annual Meeting and World Conference on Industrial Applications of Electrical Energy (Cat. No.00CH37129).

A new integrated silicon gate technology combining bipolar linear, CMOS logic, and DMOS power parts

P. Galbiati, C. Contiero, A. Andreini, 1986, IEEE Transactions on Electron Devices.

Overstress and electrostatic discharge in CMOS and BCD integrated circuits

Gaudenzio Meneghesso, Giuseppe Croce, Mauro Ciappa, 2000 .