Y. Okada

HiSIM_GaN: Compact Model for GaN-HEMT With Accurate Dynamic Current-Collapse Reproduction

H. Mattausch, W. Saito, M. Miura-Mattausch, 2019, IEEE Transactions on Electron Devices.

Analysis of GaN-HEMTs switching characteristics for power applications with compact model including parasitic contributions

H. Mattausch, W. Saito, M. Miura-Mattausch, 2016, 2016 28th International Symposium on Power Semiconductor Devices and ICs (ISPSD).

Ising spin-grass error correction for unreliable nanoelectronic logic circuits

Chang-Jun Ahn, Hisato Fujisaka, Takeshi Kamio, 2009, 2009 European Conference on Circuit Theory and Design.