F. Alagi

Compact Modelling of the Hot-Carrier Degradation of Integrated HV MOSFETs

F. Alagi, 2015 .

Reliability and performance optimization of 42V N-channel drift MOS transistor in advanced BCD technology

P. Gattari, G. Croce, F. Alagi, 2011, 2011 IEEE 23rd International Symposium on Power Semiconductor Devices and ICs.

True constant temperature MTF test system for the characterization of electromigration of thick Cu interconnection lines

Calogero Pace, Carmine Ciofi, F. Alagi, 2002, Microelectron. Reliab..

Hot-carrier-induced time dependent dielectric breakdown in high voltage pMOSFETs

F. Alagi, F. Alagi, 2011, Microelectron. Reliab..

A study of the interface-trap activation kinetics in the Negative Bias Temperature Instability

Filippo Alagi, F. Alagi, 2014, Microelectron. Reliab..