S. Carniello
发表
J. M. Park,
H. Enichlmair,
S. Carniello,
2009,
2009 IEEE International Reliability Physics Symposium.
J. Kraft,
F. Schrank,
F. Roger,
2012,
IEEE Transactions on Device and Materials Reliability.
S. Selberherr,
Z. Ali,
L. Filipovic,
2019,
Sensor Systems Simulations.
I. Starkov,
T. Grasser,
C. Jungemann,
2010,
2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.
S. Selberherr,
Z. Ali,
L. Filipovic,
2019
.
S. Selberherr,
R. Orio,
S. Carniello,
2008,
ECS Transactions.
S. Selberherr,
H. Ceric,
S. Carniello,
2008,
2008 International Conference on Simulation of Semiconductor Processes and Devices.
J. Keckes,
S. Carniello,
G. Maier,
2019,
Thermochimica Acta.
Tibor Grasser,
Oliver Triebl,
Hajdin Ceric,
2010,
Microelectron. Reliab..
E. Seebacher,
T. Grasser,
H. Ceric,
2010,
2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.
F. Schrank,
J. Kraft,
S. Carniello,
2008,
2008 IEEE International Reliability Physics Symposium.
V. Vescoli,
S. Carniello,
E. Seebacher,
2016
.
Tibor Grasser,
Christoph Jungemann,
Hajdin Ceric,
2011
.
Siegfried Selberherr,
Lado Filipovic,
Frederic Roger,
2015,
Microelectron. Reliab..
M. Burghammer,
B. Sartory,
J. Keckes,
2014,
Proceedings of the 5th Electronics System-integration Technology Conference (ESTC).
S. Escoubas,
Stéphane Labat,
F. Schrank,
2013
.
S. Carniello,
M. Petzold,
J. Siegert,
2013,
2013 IEEE 63rd Electronic Components and Technology Conference.
E. Langer,
H. Ceric,
A. P. Singulani,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).