Mark Pelletier

The influence of self heating on the measurement of hot carrier degradation in high voltage n-channel LDMOS

J. Hao, Mark Pelletier, R. Murphy, 2017, 2017 IEEE International Reliability Physics Symposium (IRPS).

Self heating effect on hot carrier degradation characteristic in high voltage n-channel LDMOS

J. Hao, Mark Pelletier, R. Murphy, 2014, 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW).