B. McGowan

The influence of self heating on the measurement of hot carrier degradation in high voltage n-channel LDMOS

J. Hao, Mark Pelletier, R. Murphy, 2017, 2017 IEEE International Reliability Physics Symposium (IRPS).

Effects of electrical bias and temperature stress on the negative magnetoresistance of a low-k dielectric

J. Lloyd, B. McGowan, W. Nolting, 2015 .

Negative magnetoresistance in a low-k dielectric

James R. Lloyd, J. Lloyd, B. McGowan, 2014 .

Decay of magnetoresistance in a low-k dielectric upon application of electrical bias and temperature stress

J. Lloyd, B. McGowan, Anne M. Kennedy, 2015, 2015 IEEE International Integrated Reliability Workshop (IIRW).

Drift region engineering to reduce hot carrier effects on high voltage MOSFETs

J. Hao, B. McGowan, T. Kopley, 2018, 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT).

Nickel Silicide Electromigration on Micro Ring Modulators for Silicon Photonics Technology

M. Rakowski, B. McGowan, Seungman Choi, 2023, IEEE International Reliability Physics Symposium.