C. Lou
发表
D. Chan,
W. Chim,
C. Lou,
1998
.
D. Chan,
W. Chim,
C. Lou,
1998,
28th European Solid-State Device Research Conference.
D. Chan,
W. Chim,
Y. Pan,
1997
.
D. Chan,
W. Chim,
Y. Pan,
1997,
IEEE Electron Device Letters.
M. Li,
D. Chan,
W. Chim,
1997,
IEEE Electron Device Letters.
D. Chan,
W. Chim,
Y. Pan,
1997
.
Wai Kin Chim,
C. L. Lou,
D. Chan,
1998
.
D. Chan,
W. Chim,
Y. Pan,
1995,
Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
D. Chan,
C. Lou,
W. Chim,
1999,
Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394).
Hot-carrier reliability of n- and p- channel MOSFETS with polysilicon and CVD tungsten-polycide gate
D. Chan,
Y. Pan,
C. Lou,
1996,
Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis.
D. Chan,
W. Chim,
Y. Pan,
1996
.
D. Chan,
C. Lou,
W. Chim,
1997,
Proceedings of the 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
Y. Pan,
C. Lou,
D.S.H. Chan,
1995,
Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
Wai Kin Chim,
C. L. Lou,
D. Chan,
1997
.