T. Janik

Analysis of the MOS transistor based on the self-consistent solution to the Schrodinger and Poisson equations and on the local mobility model

B. Majkusiak, T. Janik, 1998 .

Semiconductor thickness effects in the double-gate SOI MOSFET

Bogdan Majkusiak, B. Majkusiak, J. Walczak, 1998 .

Comparison of gate leakage current components in metal-insulator-semiconductor structures with high-k gate dielectris

B. Majkusiak, T. Janik, A. Jakubowski, 2001 .

Influence of carrier energy quantization on the gate-induced drain breakdown

B. Majkusiak, T. Janik, 1995 .

Electron energy quantization effects in the very thin film GAA SOI transistor

B. Majkusiak, T. Janik, 1997 .

Influence of carrier energy quantization on threshold voltage of metal‐oxide‐semiconductor transistor

Bogdan Majkusiak, B. Majkusiak, T. Janik, 1994 .