B. French

发表

Investigation of the impact of insulator material on the performance of dissimilar electrode metal-insulator-metal diodes

J. F. Conley, S. King, N. Alimardani, 2014 .

Light-induced enhancement of quantum dot photovoltaic devices with nitrogen doped titanium oxide capping layers

T. Alford, Jialin Yu, G. Jabbour, 2013 .

Investigation of the fracture toughness of radio frequency magnetron sputtered Al–Cu–Fe films via white-beam synchrotron radiography/topography

B. French, J. Bilello, M. Daniels, 2005 .

Laue transmission diffraction optics for thin film stress calculation

B. French, J. Bilello, 2003 .

Valence band offset at the amorphous hydrogenated boron nitride-silicon (100) interface

M. Kuhn, J. Bielefeld, S. King, 2012 .

Evolution of structure and morphology during plasma-enhanced chemical vapor deposition of carbon nanosheets

B. Holloway, B. French, M. Zhu, 2006 .

Structural characterization of carbon nanosheets via x-ray scattering

B. Holloway, B. French, M. Zhu, 2005 .

Valence band offset and Schottky barrier at amorphous boron and boron carbide interfaces with silicon and copper

M. Kuhn, J. Bielefeld, S. King, 2013 .

X-ray photoelectron spectroscopy measurement of the Schottky barrier at the SiC(N)/Cu interface

Benjamin French, Marc French, Sean W. King, 2011 .

X-ray Photoelectron Spectroscopy Investigation of the Schottky Barrier at a-BN:H/Cu Interfaces

M. Kuhn, J. Bielefeld, S. King, 2011 .

Valence and conduction band offsets at amorphous hexagonal boron nitride interfaces with silicon network dielectrics

Anthony N. Caruso, Benjamin French, Justin Brockman, 2014 .

X-ray photoelectron spectroscopy investigation of the Schottky barrier at low-k a-SiO(C):H/Cu interfaces

Benjamin French, Marc French, Sean W. King, 2011 .

Valence and conduction band offsets at low-k a-SiOxCy:H/a-SiCxNy:H interfaces

Benjamin French, Justin Brockman, Marc French, 2014 .

Detection of defect states in low-k dielectrics using reflection electron energy loss spectroscopy

Benjamin French, Sean W. King, S. King, 2013 .

In situ observations of the real-time stress-evolution and delamination of thin Ta films on Si(100)

B. French, J. Bilello, 2004 .

Real-Time in Situ Imaging of the Delamination of thin Ta Films on Si(100) Substrates Via a Synchrotron Radiation Technique

B. French, J. Bilello, 2001 .

Investigation of atomic layer deposited beryllium oxide material properties for high-k dielectric applications

S. Banerjee, W. Lanford, M. Kuhn, 2014 .

Measurement of the band gap by reflection electron energy loss spectroscopy

S. King, B. French, M. Vos, 2016 .

Band diagram for low-k/Cu interconnects: The starting point for understanding back-end-of-line (BEOL) electrical reliability

Markus G. Kuhn, Xin Liu, Patrick M. Lenahan, 2016, Microelectron. Reliab..

Detection of surface electronic defect states in low and high-k dielectrics using reflection electron energy loss spectroscopy

Benjamin French, Sean W. King, S. King, 2013 .

Band Alignment at Molybdenum Disulphide/Boron Nitride/Aluminum Oxide Interfaces

M. Kuhn, Yu‐Chuan Lin, A. Voevodin, 2016, Journal of Electronic Materials.

In situ Fracture and Adhesion Failure of Al-Cu-Fe Quasicrystalline Films

B. French, J. Bilello, M. Daniels, 2002 .

Palladium−Polyimide Nanocomposite Membranes: Synthesis and Characterization of Reflective and Electrically Conductive Surface-Metallized Films

B. French, R. E. Southward, Luke M. Davis, 2005 .