T. Köster

发表

FLOX—an oxygen-flux-measuring system using a phase-modulation method to evaluate the oxygen-dependent fluorescence lifetime

D. Lübbers, E. Voges, G. Holst, 1995 .

Investigation of Si/SiGe heterostructures patterned by reactive ion etching

H. Roskos, H. Kurz, G. Abstreiter, 1996 .

A triangle‐shaped nanoscale metal–oxide–semiconductor device

H. Roskos, H. Kurz, B. Spangenberg, 1996 .

SiGe wires and dots grown by local epitaxy

H. Roskos, H. Kurz, H. Gossner, 1995 .

Fabrication and characterisation of locally grown SiGe wires and dots

H. Roskos, H. Kurz, H. Gossner, 1995 .

Fabrication and characterization of Si/SiGe nanometer structures

H. Roskos, H. Kurz, I. Eisele, 1995 .

Fabrication of silicon and metal nanowires and dots using mechanical atomic force lithography

H. Kurz, B. Spangenberg, T. Köster, 1998 .