H. Osman

Above-IC generic poly-SiGe thin film wafer level packaging and MEM device technology: Application to accelerometers

S. Decoutere, I. De Wolf, J. de Coster, 2011, 2011 IEEE 24th International Conference on Micro Electro Mechanical Systems.

Contact reliability improvement of a poly-SiGe based nano-relay with titanium nitride coating

K. De Meyer, H. Tilmans, S. Severi, 2015, 2015 Transducers - 2015 18th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS).

(Invited) SiGe MEMS Technology: A Platform Technology Enabling Different Demonstrators

Robert Puers, Herbert De Smet, Simone Severi, 2010 .

GaN-on-Si: A scalable material system to realize cost effective next-generation solid state lighting and power devices

S. Decoutere, B. Dutta, S. Biesemans, 2010, 2010 Symposium on VLSI Technology.

Gan-on-Si process defect detection and analysis for HB-LEDs and power devices

E. Rosseel, A. Mani, H. Osman, 2013, ASMC 2013 SEMI Advanced Semiconductor Manufacturing Conference.

Detection, binning, and analysis of defects in a GaN-on-Si process for High Brightness Light Emitting Diode's

B. Dutta, A. Mani, H. Osman, 2012, 2012 SEMI Advanced Semiconductor Manufacturing Conference.

A Versatile LPCVD Silicon Nitride Platform For Heterogenous Photonic Circuits: Ultra Tight Thickness Control And Low Propagation Loss

A. Ray Chaudhuri, A. Firrincieli, Ph. Helin, 2019, 2019 24th OptoElectronics and Communications Conference (OECC) and 2019 International Conference on Photonics in Switching and Computing (PSC).

Quantum efficiency and dark current evaluation of a backside illuminated CMOS image sensor

K. Minoglou, Luc Haspeslagh, Klaas Tack, 2015 .

On the Fabrication of Backside Illuminated Image Sensors: Bonding Oxide, Edge Trimming and CMP Rework Routes

Farid Sebaai, Lan Peng, Deniz Sabuncuoglu Tezcan, 2015 .