N. Hirashita

发表

N. Hirashita, M. Urano, H. Yoshida, 2014 .

T. Tezuka, J. Koga, S. Takagi, 2003, IEEE International Electron Devices Meeting 2003.

A. Rockett, J. Knall, J. Greene, 1987 .

M. Okihara, N. Hirashita, K. Nishi, 1993, [Proceedings] 1993 International Workshop on VLSI Process and Device Modeling (1993 VPAD).

N. Sugiyama, S. Takagi, Y. Moriyama, 2006, 2006 International SiGe Technology and Device Meeting.

N. Hirashita, T. Kambara, K. Gondaira, 1981 .

N. Sugiyama, S. Takagi, Y. Moriyama, 2006, ECS Transactions.

T. Irisawa, T. Numata, N. Sugiyama, 2006, 2006 International SiGe Technology and Device Meeting.

N. Sugiyama, S. Takagi, T. Tezuka, 2006, 2006 International SiGe Technology and Device Meeting.

J. Birch, U. Helmersson, J. Greene, 1991 .

N. Hirashita, J. Zhang, K. Maejima, 2016 .

N. Sugiyama, S. Takagi, T. Tezuka, 2006, 2006 International SiGe Technology and Device Meeting.

S. Sugahara, T. Tezuka, N. Sugiyama, 2008, IEEE Transactions on Electron Devices.

T. Tezuka, N. Hirashita, T. Numata, 2006, IEEE Transactions on Electron Devices.

N. Hirashita, Hidetsugu Uchida, T. Ajioka, 1993 .

N. Hirashita, Y. Nagatomo, H. Uchida, 1992, 50th Annual Device Research Conference.

N. Hirashita, H. Uchida, N. Hirashita, 1998, ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157).

N. Hirashita, T. Shigenobu, H. Uchida, 1993, ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures.

Hiroyuki Tanaka, N. Hirashita, Hidetsugu Uchida, 1992, 30th Annual Proceedings Reliability Physics 1992.

T. Tezuka, J. Koga, N. Hirashita, 2004, IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..

T. Tezuka, N. Sugiyama, T. Mizuno, 2005, Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005..